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Charging Effects in Al-SiO2-p-Si Structures After Low-Energy Electron Beam Irradiation.
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- Journal of Electronic Materials, 2020, v. 49, n. 9, p. 5178, doi. 10.1007/s11664-020-08080-3
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Investigation of the Effect of Irradiation by a Low-Energy Electron Beam on the Capacitance–Voltage Characteristics of SiO<sub>2</sub>.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2021, v. 15, n. 5, p. 1045, doi. 10.1134/S1027451021050323
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- Article