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Oxygen accumulation effect for depth profiling of thin-multilayered sample using low-energy oxygen ion beam.
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- Surface & Interface Analysis: SIA, 2013, v. 45, n. 1, p. 107, doi. 10.1002/sia.5107
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- Article
Matrix effect-free depth profiling of implanted Mg in Al <sub>x</sub>Ga<sub>1- x</sub>As/GaAs multi-layers by resonance enhanced multiphoton laser post-ionization sputtered neutral mass spectrometry.
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- Surface & Interface Analysis: SIA, 2012, v. 44, n. 6, p. 641, doi. 10.1002/sia.4873
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- Article
Morphological Stability Limits of Ag–Cu–Al Nanocrystalline Thin Films Prepared via Reactive Sputtering in Ar–O<sub>2</sub> Mixed Gas.
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- Metallurgical & Materials Transactions. Part A, 2024, v. 55, n. 9, p. 3235, doi. 10.1007/s11661-024-07462-0
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- Article
Thermal Stability of Nanocrystalline Ag–Cu–Al Alloy Films with Densely Dispersed Alumina Particles Prepared via Reactive Sputtering Using Ar–O<sub>2</sub> Mixed Gas.
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- Metallurgical & Materials Transactions. Part A, 2024, v. 55, n. 7, p. 2264, doi. 10.1007/s11661-024-07392-x
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- Article