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Controlling Depth Resolution of Phase Images by Ptychography using Achromatic Condition.
- Published in:
- 2020
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- Publication type:
- Abstract
Controlling Depth Resolution of Phase Images by Ptychography using Achromatic Condition.
- Published in:
- 2020
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- Publication type:
- Abstract
Atomic Resolution Imaging and Analysis of Graphene at Low Acceleration Voltages using Aberration Corrected Microscope with Cold Field Emission Gun.
- Published in:
- Microscopy & Microanalysis, 2019, p. 128, doi. 10.1017/S1431927618001137
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- Article
Low Dose Imaging by STEM Ptychography Using Pixelated STEM Detector.
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- Microscopy & Microanalysis, 2019, p. 198, doi. 10.1017/S1431927618001484
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- Article
Strain Analysis of FinFET Device Utilizing Moiré Fringes in Scanning Transmission Electron Microscopy.
- Published in:
- 2019
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- Abstract
Energy Selected Secondary Electron Image Revealing Surface Potential by High Accelerating Voltage Scanning Electron Microscope.
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- Microscopy & Microanalysis, 2019, p. 1514, doi. 10.1017/S143192761800805X
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- Article
3aA_MI-5Low Dose Ptychographic STEM Observation Using Fast Pixelated Detector.
- Published in:
- 2018
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- Publication type:
- Abstract
3aA_MI-7Atomic Resolution Imaging and Analysis of 2D-materials at Low Acceleration Voltages using Aberration Corrected Microscope with Cold Field Emission Gun.
- Published in:
- 2018
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- Publication type:
- Abstract
Atomic Resolution Imaging and Analysis of Graphene at Low Acceleration Voltages using Aberration Corrected Microscope with Cold Field Emission Gun.
- Published in:
- 2018
- By:
- Publication type:
- Abstract
Low Dose Imaging by STEM Ptychography Using Pixelated STEM Detector.
- Published in:
- 2018
- By:
- Publication type:
- Abstract
Strain Analysis of FinFET Device Utilizing Moiré Fringes in Scanning Transmission Electron Microscopy.
- Published in:
- 2018
- By:
- Publication type:
- Abstract
Energy Selected Secondary Electron Image Revealing Surface Potential by High Accelerating Voltage Scanning Electron Microscope.
- Published in:
- 2018
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- Publication type:
- Abstract
Development of a secondary electron energy analyzer for a transmission electron microscope.
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- Microscopy, 2018, v. 67, n. 2, p. 121, doi. 10.1093/jmicro/dfx126
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- Article
Annular Bright-Field Scanning Transmission Electron Microscopy: Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials.
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- Microscopy Today, 2017, v. 25, n. 6, p. 36, doi. 10.1017/S1551929517001006
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- Article
Development of Fast Pixelated STEM Detector and its Applications using 4-Dimensional Dataset.
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- Microscopy & Microanalysis, 2017, v. 23, p. 52, doi. 10.1017/S1431927617000940
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- Article
Advanced 4D STEM Imaging with the pnCCD (S)TEM Camera.
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- Microscopy & Microanalysis, 2017, v. 23, p. 58, doi. 10.1017/S1431927617000976
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- Publication type:
- Article
Near Shadowless EDS Tomography for Sliced Sample Realized by X-ray Collection with One Large Sized SDD Detector.
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- Microscopy & Microanalysis, 2017, v. 23, p. 1084, doi. 10.1017/S1431927617006080
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- Article
Way to Reduce Electron Dose in Pseudo Atomic Column Elemental Maps by 2D STEM Moiré Method.
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- Microscopy & Microanalysis, 2017, v. 23, p. 1790, doi. 10.1017/S1431927617009618
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- Article
Accelerating Voltage and Probe Current Dependence of Electron Beam Drilling Rates for Silicon Crystal.
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- Microscopy & Microanalysis, 2017, v. 23, p. 1828, doi. 10.1017/S1431927617009801
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- Article
Phase-contrast scanning transmission electron microscopy.
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- Microscopy, 2015, v. 64, n. 3, p. 181, doi. 10.1093/jmicro/dfv011
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- Article
Magnified pseudo-elemental map of atomic column obtained by Moiré method in scanning transmission electron microscopy.
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- Microscopy, 2014, v. 63, n. 5, p. 391, doi. 10.1093/jmicro/dfu024
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- Article
First Demonstration of Phase Contrast Scanning Transmission Electron Microscopy.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 224, doi. 10.1017/S1431927614002840
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- Article
Atomic Column Elemental Mapping by STEM-Moire Method.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 586, doi. 10.1017/S1431927614004656
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- Article
Accuracy of Strain in Strain Maps Improved by Averaging Multiple Maps.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 1068, doi. 10.1017/S1431927614007065
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- Article
Image Collection using an Auto Data Acquisition System and An Application to Ice embedded Ribosome.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 1114, doi. 10.1017/S1431927614007302
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- Article
Development of Cs and Cc correctors for transmission electron microscopy.
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- Microscopy, 2013, v. 62, n. 1, p. 23, doi. 10.1093/jmicro/dfs134
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- Article
Differential phase-contrast microscopy at atomic resolution.
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- Nature Physics, 2012, v. 8, n. 8, p. 611, doi. 10.1038/nphys2337
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- Article
Quantitative annular dark-field STEM images of a silicon crystal using a large-angle convergent electron probe with a 300-kV cold field-emission gun.
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- Journal of Electron Microscopy, 2011, v. 60, n. 2, p. 109, doi. 10.1093/jmicro/dfq084
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- Article
Direct imaging of hydrogen-atom columns in a crystal by annular bright-field electron microscopy.
- Published in:
- Nature Materials, 2011, v. 10, n. 4, p. 278, doi. 10.1038/nmat2957
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- Article
Direct imaging of lithium atoms in LiV2O4 by spherical aberration-corrected electron microscopy.
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- Journal of Electron Microscopy, 2010, v. 59, n. 6, p. 457
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- Article
New area detector for atomic-resolution scanning transmission electron microscopy.
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- Journal of Electron Microscopy, 2010, v. 59, n. 6, p. 473, doi. 10.1093/jmicro/dfq014
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- Article
Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun.
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- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S7, doi. 10.1093/jmicro/dfq027
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- Article
Dependence of beam broadening on detection angle in scanning transmission electron microtomography.
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- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S45, doi. 10.1093/jmicro/dfq030
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- Article
Correction of higher order geometrical aberration by triple 3-fold astigmatism field.
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- Journal of Electron Microscopy, 2009, v. 58, n. 6, p. 341, doi. 10.1093/jmicro/dfp033
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- Article
STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun.
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- Journal of Electron Microscopy, 2009, v. 58, n. 6, p. 357, doi. 10.1093/jmicro/dfp030
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- Article
Development of a multifunctional TEM specimen holder equipped with a piezodriving probe and a laser irradiation port.
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- Journal of Electron Microscopy, 2009, v. 58, n. 4, p. 245, doi. 10.1093/jmicro/dfp018
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- Article
Visualizing and identifying single atoms using electron energy-loss spectroscopy with low accelerating voltage.
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- Nature Chemistry, 2009, v. 1, n. 5, p. 415, doi. 10.1038/nchem.282
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- Article
Ultrahigh-Vacuum Third-Order Spherical Aberration ~Cs! Corrector for a Scanning Transmission Electron Microscope.
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- Microscopy & Microanalysis, 2006, v. 12, n. 6, p. 456, doi. 10.1017/S1431927606060661
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- Article
High‐resolution ultrahigh‐vacuum electron microscopy of helical gold nanowires: junction and thinning process.
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- Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 49, doi. 10.1093/jmicro/52.1.49
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- Article
Quantized conductance through individual rows of suspended gold atoms.
- Published in:
- Nature, 1998, v. 395, n. 6704, p. 780, doi. 10.1038/27399
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- Article