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Reduction of leakage current at the SiN<sub>x</sub>/GaN interface in GaN Schottky diodes.
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- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 22, p. 19353, doi. 10.1007/s10854-018-0064-3
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- Article
Proactive modeling: a new model intelligence technique.
- Published in:
- Software & Systems Modeling, 2017, v. 16, n. 2, p. 499, doi. 10.1007/s10270-015-0465-1
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- Article