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Exciting Possibilities of Soft X-ray Emission Spectroscopy as Chemical State Analysis in EPMA and FESEM.
- Published in:
- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 684, doi. 10.1017/S1431927614005145
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- Article
Present State of TEM-SXES Analysis and its Application to SEM aiming Chemical Analysis of Bulk Materials.
- Published in:
- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 682, doi. 10.1017/S1431927614005133
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- Article
High spatial resolution X-ray spectra of Mg, Al, Si and P L-emission observed with a newly developed soft X-ray spectrometer for EPMA.
- Published in:
- 2012
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- Abstract
Characteristics in valence-band emission spectra of simple metals and transition metals obtained by SXES-TEM.
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- 2012
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- Abstract
An Extension up to 4 keV by a Newly Developed Multilayer-Coated Grating for TEM-SXES Spectrometer.
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- 2011
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- Abstract
A Soft X-ray Emission Specrometer with High-energy Resolution for Electron Probe Microanalysis.
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- 2010
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- Abstract
Li K-Emission Measurements Using a Newly Developed SXES-TEM Instrument.
- Published in:
- 2010
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- Publication type:
- Abstract