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SEM observation and analysis of InGaN/GaN multiple quantum well structure using obliquely polished sample.
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- Microscopy, 2017, v. 66, n. 2, p. 131, doi. 10.1093/jmicro/dfw101
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Observation of the potential distribution in GaN-based devices by a scanning electron microscope.
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- Microscopy, 2014, v. 63, n. suppl_1, p. i22, doi. 10.1093/jmicro/dfu051
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- Article