Works by Kapur, Rohit

Results: 7

New scan compression approach to reduce the test data volume.

Published in:

IET Computers & Digital Techniques (Wiley-Blackwell), 2021, v. 15, n. 4, p. 251, doi. 10.1049/cdt2.12020

By:

Shantagiri, Pralhadrao V.;
Kapur, Rohit;
Shastry, Chandrasekar

Publication type:

Article

Handling Unknown with Blend of Scan and Scan Compression.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 2, p. 135, doi. 10.1007/s10836-018-5717-x

By:

Shantagiri, Pralhadrao V.;
Kapur, Rohit

Publication type:

Article

Small Test Set Generation with High Diagnosability.

Published in:

Journal of Circuits, Systems & Computers, 2016, v. 25, n. 4, p. 1, doi. 10.1142/S0218126616500249

By:

Bhar, Anupam;
Chattopadhyay, Santanu;
Sengupta, Indranil;
Kapur, Rohit

Publication type:

Article

Image Captioning Generator Text-to-Speech.

Published in:

International Journal of Next-Generation Computing, 2022, v. 13, n. 3, p. 449

By:

Sharma, Tripti;
Anand, Neetu;
Gaurav, Kumar;
Kapur, Rohit

Publication type:

Article

Applying Advanced Fault Models.

Published in:

EE: Evaluation Engineering, 2004, v. 43, n. 3, p. 48

By:

Jayaram, Vinay;
Hay, Cy;
Kapur, Rohit

Publication type:

Article

CTL: The New Language of DFT.

Published in:

EE: Evaluation Engineering, 2003, v. 42, n. 10, p. 20

By:

Miller, Kathleen R.;
Lonowski, Wayne J.;
Kapur, Rohit;
Harrod, Peter;
Appello, Davide

Publication type:

Article

Aggressive Exclusion of Scan Flip-Flops from Compression Architecture for Better Coverage and Reduced TDV: A Hybrid Approach.

Published in:

Journal of Low Power Electronics & Applications, 2019, v. 9, n. 2, p. 18, doi. 10.3390/jlpea9020018

By:

Shantagiri, Pralhadrao V.;
Kapur, Rohit

Publication type:

Article