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Charge-transfer-based Gas Sensing Using Atomic-layer MoS<sub>2</sub>.
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- Scientific Reports, 2015, p. 8052, doi. 10.1038/srep08052
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- Article
Quantitatively estimating defects in graphene devices using discharge current analysis method.
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- Scientific Reports, 2014, p. 1, doi. 10.1038/srep04886
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- Article
Gamma-Irradiation-Induced Electrical Characteristic Variations in MoS 2 Field-Effect Transistors with Buried Local Back-Gate Structure.
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- Nanomaterials (2079-4991), 2024, v. 14, n. 16, p. 1324, doi. 10.3390/nano14161324
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- Article