DEGRADATION PROCESSES IN THE AI-TI-SI SYSTEM UNDER THERMAL SHOCK.
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- Periódico Tchê Química, 2020, v. 17, n. 34, p. 335, doi. 10.52571/ptq.v17.n34.2020.352_p34_pgs_335_342.pdf
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- Article
Works by KORYACHKO, Marina V.
Results: 4
1
2
DEFLECTED STATE OF SEMICONDUCTOR NEAR-CONTACT REGION AT ELECTRODEGRADATION OF METALLIZATION TRACK ON ITS SURFACE.
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- Periódico Tchê Química, 2019, v. 16, n. 33, p. 707, doi. 10.52571/ptq.v16.n33.2019.722_periodico33_pgs_707_715.pdf
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- Publication type:
- Article
3
MELT DROPS MOVEMENT OVER SEMICONDUCTOR SURFACES CONTROLLED BY ELECTRIC FIELD.
- Published in:
- Periódico Tchê Química, 2019, v. 16, n. 33, p. 681, doi. 10.52571/ptq.v16.n33.2019.696_periodico33_pgs_681_687.pdf
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- Publication type:
- Article
4
O EFEITO DE CAMADAS DIELÉTRICAS FINAIS DO SILÍCIO NA DINÂMICA DE AQUECIMENTO DE INTERCONEXÃO EM CHOQUE TÉRMICO.
- Published in:
- Periódico Tchê Química, 2019, v. 16, n. 33, p. 448
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- Publication type:
- Article