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A Yee-based expanded node with dielectric boundary conditions for the TLM method.
- Published in:
- Microwave & Optical Technology Letters, 1999, v. 20, n. 6, p. 398, doi. 10.1002/(SICI)1098-2760(19990320)20:6<398::AID-MOP12>3.0.CO;2-N
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- Article