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Maskless Lithography and in situ Visualization of Conductivity of Graphene using Helium Ion Microscopy.
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- Scientific Reports, 2015, p. 11952, doi. 10.1038/srep11952
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- Article
A simple specimen holder for EBIC imaging on the Hitachi S800.
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- Microscopy Research & Technique, 1993, v. 26, n. 2, p. 182, doi. 10.1002/jemt.1070260214
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- Article
Electron beam induced radiation damage in the catalyst layer of a proton exchange membrane fuel cell.
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- Scanning, 2014, v. 36, n. 3, p. 338, doi. 10.1002/sca.21117
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- Article
Do SE<sub>II</sub> Electrons Really Degrade SEM Image Quality?
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- Scanning, 2013, v. 35, n. 1, p. 1, doi. 10.1002/sca.21027
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- Article
EDITORIAL.
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- Scanning, 2011, v. 33, n. 3, p. 109, doi. 10.1002/sca.20242
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- Article
EDITORIAL.
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- Scanning, 2010, v. 32, n. 6, p. 345, doi. 10.1002/sca.20208
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- Article
SCANNING Celebrates 30 Years.
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- Scanning, 2008, v. 30, n. 1, p. 1, doi. 10.1002/sca.20099
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- Article
Effect of Electron Beam-Induced Deposition and Etching Under Bias.
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- Scanning, 2007, v. 29, n. 4, p. 171, doi. 10.1002/sca.20060
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- Article
On the Production of X-rays by Low Energy Ion Beams.
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- Scanning, 2007, v. 29, n. 1, p. 1, doi. 10.1002/sca.20002
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- Article
Pressure effect of growing with electron beam-induced deposition with tungsten hexafluoride and tetraethylorthosilicate precursor.
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- Scanning, 2006, v. 28, n. 6, p. 311, doi. 10.1002/sca.4950280603
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- Article
Nanotip electron gun for the scanning electron microscope.
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- Scanning, 2006, v. 28, n. 3, p. 133, doi. 10.1002/sca.4950280301
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- Article
An experimental model of beam broadening in the variable pressure scanning electron microscope.
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- Scanning, 2005, v. 27, n. 6, p. 293, doi. 10.1002/sca.4950270604
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- Article
A novel technique for visualizing electron beam induced charging.
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- Scanning, 2004, v. 26, n. 5, p. 226, doi. 10.1002/sca.4950260503
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- Article
Measurement of total gas scattering cross-section.
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- Scanning, 2003, v. 25, n. 6, p. 285, doi. 10.1002/sca.4950250603
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- Article
Quantitative measurements of charging in a gaseous environment.
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- Scanning, 2003, v. 25, n. 4, p. 194, doi. 10.1002/sca.4950250406
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- Publication type:
- Article
A method to measure the effective gas path length in the environmental or variable pressure scanning electron microscope.
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- Scanning, 2002, v. 24, n. 4, p. 171, doi. 10.1002/sca.4950240402
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- Article
Imaging thin and thick sections of biological tissue with the secondary electron detector in a field-emission scanning electron microscope.
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- Scanning, 1997, v. 19, n. 6, p. 387, doi. 10.1002/sca.4950190601
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- Article
CASINO: A new monte Carlo code in C language for electron beam interactions-part III: Stopping power at low energies.
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- Scanning, 1997, v. 19, n. 1, p. 29, doi. 10.1002/sca.4950190104
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- Article
Measuring the performance of scanning electron microscope detectors.
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- Scanning, 1996, v. 18, n. 8, p. 533, doi. 10.1002/sca.4950180802
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- Article
A database on electron-solid interactions.
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- Scanning, 1995, v. 17, n. 5, p. 270, doi. 10.1002/sca.4950170501
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- Article
A formula to explain electron backscattering in solids.
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- Scanning, 1995, v. 17, n. 2, p. 63, doi. 10.1002/sca.4950170201
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- Article
Computation of polar angle of collisions from partial elastic mott cross-sections.
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- Scanning, 1994, v. 16, n. 2, p. 67, doi. 10.1002/sca.4950160202
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- Article
Practical methods in electron microscopy vol. 11: Thin foil preparation for electron microscopy By P.J. Goodhew Edited by A.M. Glauert Elsevier Science Publishing Co., New York (1985) ISBN 0-444-806-997; illustrated, $31.50.
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- Scanning, 1994, v. 16, n. 1, p. 58, doi. 10.1002/sca.4950160110
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- Article
Scanning tunneling microscopy I Edited by H.-J. Güntherodt, R. Wiesendanger Springer-Verlag, New York (1992) ISBN 0-387-54308-2; $59.00.
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- Scanning, 1993, v. 15, n. 3, p. 176, doi. 10.1002/sca.4950150314
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- Article
The TriField<sup>TM</sup> field meter.
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- Scanning, 1993, v. 15, n. 1, p. 48, doi. 10.1002/sca.4950150108
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- Article
Electron microbeam analysis A. Boekestein and M.K. Pavicevic Springer Verlag, New York (1992) ISBN 82359 X Price: $120.00.
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- Scanning, 1993, v. 15, n. 1, p. 51, doi. 10.1002/sca.4950150111
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- Article
Mac X-ray: The NIST 'DTSA' program and the 4pi analysis board.
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- Scanning, 1992, v. 14, n. 4, p. 233, doi. 10.1002/sca.4950140409
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- Article
Modern microscopies-techniques and applications Edited by P.J. Duke and A.G. Michette Plenum Press, New York and London (1990) ISBN 0-306-43288-9.
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- Scanning, 1992, v. 14, n. 4, p. 241, doi. 10.1002/sca.4950140411
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- Article
Nanoscale characterization of surfaces and interfaces. By N. John DiNardo, VCH, Weinheim 1994, X, 163 pp., hardcover, ISBN 3-527-29247-0.
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- Advanced Materials, 1996, v. 8, n. 2, p. 186, doi. 10.1002/adma.19960080223
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- Article
Nanoscale Imaging of Whole Cells Using a Liquid Enclosure and a Scanning Transmission Electron Microscope.
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- PLoS ONE, 2009, v. 4, n. 12, p. 1, doi. 10.1371/journal.pone.0008214
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- Article
Nanoforging Single Layer MoSe<sub>2</sub> Through Defect Engineering with Focused Helium Ion Beams.
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- Scientific Reports, 2016, p. 30481, doi. 10.1038/srep30481
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- Article
Contrast in high-resolution scanning electron microscope images.
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- Journal of Microscopy, 1991, v. 161, n. 2, p. 343, doi. 10.1111/j.1365-2818.1991.tb03095.x
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- Article
Fast Monte Carlo method for simulating electron scattering in solids.
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- Journal of Microscopy, 1989, v. 156, n. 3, p. 285, doi. 10.1111/j.1365-2818.1989.tb02930.x
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- Article
A model for calculating secondary and backscattered electron yields.
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- Journal of Microscopy, 1987, v. 147, n. 1, p. 51, doi. 10.1111/j.1365-2818.1987.tb02817.x
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- Article
The interpretation of EBIC images using Monte Carlo simulations.
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- Journal of Microscopy, 1986, v. 143, n. 3, p. 233, doi. 10.1111/j.1365-2818.1986.tb02780.x
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- Article
Resolution in low voltage scanning electron microscopy.
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- Journal of Microscopy, 1985, v. 140, n. 3, p. 283, doi. 10.1111/j.1365-2818.1985.tb02682.x
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- Article
Beam interactions, contrast and resolution in the SEM.
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- Journal of Microscopy, 1984, v. 136, n. 2, p. 241, doi. 10.1111/j.1365-2818.1984.tb00532.x
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- Article
A parametric partial cross section for ELS.
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- Journal of Microscopy, 1984, v. 134, n. 1, p. 89, doi. 10.1111/j.1365-2818.1984.tb00506.x
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- Article
The quantitation of electron energy loss spectra.
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- Journal of Microscopy, 1981, v. 124, n. 1, p. 37, doi. 10.1111/j.1365-2818.1981.tb01303.x
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- Article
A practical electron spectrometer for chemical analysis.
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- Journal of Microscopy, 1978, v. 114, n. 2, p. 117, doi. 10.1111/j.1365-2818.1978.tb00124.x
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- Article
The nature of defocus fringes in scanning-transmission electron microscope images.
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- Journal of Microscopy, 1976, v. 108, n. 2, p. 185, doi. 10.1111/j.1365-2818.1976.tb01089.x
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- Article
The observation of crystalline materials in the scanning electron microscope (SEM).
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- Journal of Microscopy, 1975, v. 103, n. 1, p. 1, doi. 10.1111/j.1365-2818.1975.tb04533.x
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- Publication type:
- Article
Image Contrast in Energy-Filtered BSE Images at Ultra-Low Accelerating Voltages.
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- Microscopy Today, 2016, v. 24, n. 3, p. 20, doi. 10.1017/S1551929516000390
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- Article
Multi-Beam Ion Microscopy.
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- Microscopy Today, 2012, v. 20, n. 5, p. 10, doi. 10.1017/S1551929512000569
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- Article
Microcalorimeter Detectors and Low Voltage SEM Microanalysis.
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- Microchimica Acta, 2004, v. 145, n. 1-4, p. 81, doi. 10.1007/s00604-003-0131-0
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- Publication type:
- Article
Secondary Electron Imaging in the Helium Ion Microscope.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 1100, doi. 10.1017/S1431927614007223
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- Article
Is Microanalysis Possible in the Helium Ion Microscope?
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- Microscopy & Microanalysis, 2011, v. 17, n. 4, p. 643, doi. 10.1017/S1431927611000596
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- Article
Is Microanalysis Possible in He+ Ion Microscopes?
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- 2010
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- Abstract
Selective Electron Beam Erosion and Deposition of Materials.
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- Microscopy & Microanalysis, 2005, v. 11, p. 816, doi. 10.1017/S1431927605500874
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- Article
Deconvolution of Closely Spaced Spectral Features with a Microcalorimeter EDS.
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- Microscopy & Microanalysis, 2005, v. 11, p. 464, doi. 10.1017/S1431927605507426
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- Article