Found: 29
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Sc/SiC/Al Multilayer Optimization for Li K Spectroscopy.
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- Applied Sciences (2076-3417), 2024, v. 14, n. 3, p. 956, doi. 10.3390/app14030956
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- Article
Calculation of emission spectra of lithium compounds.
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- XRS: X-ray Spectrometry, 2023, v. 52, n. 6, p. 330, doi. 10.1002/xrs.3329
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- Article
Combined x‐ray reflectivity and grazing incidence x‐ray fluorescence study of Ta/Cr/Pt thin film stacks.
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- XRS: X-ray Spectrometry, 2023, v. 52, n. 6, p. 437, doi. 10.1002/xrs.3382
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- Article
Composition and optical properties of chromium oxynitride films.
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- Surface & Interface Analysis: SIA, 2022, v. 54, n. 11, p. 1142, doi. 10.1002/sia.7138
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- Article
Study of interface reaction in a B<sub>4</sub>C/Cr mirror at elevated temperature using soft X-ray reflectivity.
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- Journal of Synchrotron Radiation, 2022, v. 29, n. 4, p. 978, doi. 10.1107/S1600577522004738
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- Article
Electron probe microanalysis of light elements: Improvements in the measurement and signal extraction methods.
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- XRS: X-ray Spectrometry, 2022, v. 51, n. 4, p. 403, doi. 10.1002/xrs.3290
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- Article
Study of buried interfaces in Fe/Si multilayer by hard x‐ray emission spectroscopy.
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- Surface & Interface Analysis: SIA, 2021, v. 53, n. 12, p. 1043, doi. 10.1002/sia.7005
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- Article
Periodic Multilayer for X-ray Spectroscopy in the Li K Range.
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- Applied Sciences (2076-3417), 2021, v. 11, n. 14, p. 6385, doi. 10.3390/app11146385
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- Article
A Simple Approach for Thickness Measurements Using Electron Probe Microanalysis.
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- Microscopy & Microanalysis, 2021, v. 27, n. 2, p. 337, doi. 10.1017/S1431927621000088
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- Article
Improving the soft X‐ray reflectivity of Cr/Ti multilayers by co‐deposition of B<sub>4</sub>C.
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- Journal of Synchrotron Radiation, 2020, v. 27, n. 6, p. 1614, doi. 10.1107/S1600577520011741
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- Article
Standardless Quantitative EPMA of Microparticles with Irregular Shapes.
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- 2020
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- Abstract
Standardless Quantitative EPMA of Microparticles with Irregular Shapes.
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- 2020
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- Abstract
Structure and optical properties of CrO<sub>x</sub>N<sub>y</sub> films with composition modulation.
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- Surface Engineering, 2020, v. 36, n. 4, p. 411, doi. 10.1080/02670844.2019.1656356
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- Article
Realization of wafer-scale nanogratings with sub-50 nm period through vacancy epitaxy.
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- Nature Communications, 2019, v. 10, n. 1, p. N.PAG, doi. 10.1038/s41467-019-10095-2
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- Article
Soft X‐ray characterization of ion beam sputtered magnesium oxide (MgO) thin film.
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- Surface & Interface Analysis: SIA, 2018, v. 50, n. 11, p. 1145, doi. 10.1002/sia.6446
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- Article
Study of the Au‐Cr bilayer system using X‐ray reflectivity, GDOES, and ToF‐SIMS.
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- Surface & Interface Analysis: SIA, 2018, v. 50, n. 11, p. 1213, doi. 10.1002/sia.6445
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- Article
Depth analysis of Al/ZrC interfaces using SIMS and x‐ray reflectivity.
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- Surface & Interface Analysis: SIA, 2018, v. 50, n. 11, p. 1239, doi. 10.1002/sia.6443
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- Article
Study of Cr/Sc-based multilayer reflecting mirrors using soft x-ray reflectivity and standing wave-enhanced x-ray fluorescence.
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- Optical Engineering, 2017, v. 56, n. 11, p. 117101-1, doi. 10.1117/1.OE.56.11.117101
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- Article
Ultra-short and ultra-intense X-ray free-electron laser single pulse in one-dimensional photonic crystals.
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- Journal of Synchrotron Radiation, 2017, v. 24, n. 2, p. 376, doi. 10.1107/S1600577517000820
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- Article
X-ray absorption spectroscopy study of buried Co layers in the Co/Mo<sub>2</sub>C multilayer mirrors.
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- Surface & Interface Analysis: SIA, 2017, v. 49, n. 3, p. 205, doi. 10.1002/sia.6116
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- Article
X-ray fluorescence induced by standing waves in the grazing-incidence and grazing-exit modes: study of the Mg-Co-Zr system.
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- Journal of Synchrotron Radiation, 2015, v. 22, n. 6, p. 1419, doi. 10.1107/S1600577515016239
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- Article
Inter-laboratory comparison of a WDS-EDS quantitative X-ray microanalysis of a metallic glass.
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- XRS: X-ray Spectrometry, 2015, v. 44, n. 1, p. 24, doi. 10.1002/xrs.2573
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- Article
Co/Mo<sub>2</sub>C multilayer as X-ray mirror: Optical and thermal performances.
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- Physica Status Solidi (B), 2014, v. 251, n. 4, p. 803, doi. 10.1002/pssb.201350082
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- Article
X-ray quasi-lamellar etched multilayers: analysis by coupled-mode theory.
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- XRS: X-ray Spectrometry, 2014, v. 43, n. 2, p. 122, doi. 10.1002/xrs.2526
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- Article
The thermal stability of Al(1%wtSi)/Zr EUV mirrors.
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- Applied Physics A: Materials Science & Processing, 2012, v. 109, n. 1, p. 133, doi. 10.1007/s00339-012-7085-1
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- Article
Cauchois and Sénémaud Tables of wavelengths of X-ray emission lines and absorption edges.
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- XRS: X-ray Spectrometry, 2011, v. 40, n. 1, p. 12, doi. 10.1002/xrs.1293
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- Article
Wavelength despersive spectroscopy analysis at high spectral resolution: application to the study of Mo/Si multilayers.
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- XRS: X-ray Spectrometry, 2007, v. 36, n. 2, p. 72, doi. 10.1002/xrs.940
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- Article
Study of the NiTi/SiO<sub>2</sub> interface: analysis of the electronic distributions.
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- Surface & Interface Analysis: SIA, 2002, v. 34, n. 1, p. 694, doi. 10.1002/sia.1390
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- Article
Study of the Interface between Polyacrylonitrile Thin Films and a Nickel Cathode: Ni 3d States Analysed by EXES.
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- Surface & Interface Analysis: SIA, 1996, v. 24, n. 5, p. 339, doi. 10.1002/(SICI)1096-9918(199605)24:5<339::AID-SIA124>3.0.CO;2-Y
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- Article