Works matching AU Jones, Jacob L.


Results: 79
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    Si Doped Hafnium Oxide-A 'Fragile' Ferroelectric System.

    Published in:
    Advanced Electronic Materials, 2017, v. 3, n. 10, p. n/a, doi. 10.1002/aelm.201700131
    By:
    • Richter, Claudia;
    • Schenk, Tony;
    • Park, Min Hyuk;
    • Tscharntke, Franziska A.;
    • Grimley, Everett D.;
    • LeBeau, James M.;
    • Zhou, Chuanzhen;
    • Fancher, Chris M.;
    • Jones, Jacob L.;
    • Mikolajick, Thomas;
    • Schroeder, Uwe
    Publication type:
    Article
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    Peroxisome Proliferator-activated Receptor-γ Deficiency Exacerbates Fibrotic Response to Mycobacteria Peptide in Murine Sarcoidosis Model.

    Published in:
    American Journal of Respiratory Cell & Molecular Biology, 2019, v. 61, n. 2, p. 198, doi. 10.1165/rcmb.2018-0346OC
    By:
    • Malur, Anagha;
    • Mohan, Arjun;
    • Barrington, Robert A.;
    • Leffler, Nancy;
    • Malur, Amrita;
    • Muller-Borer, Barbara;
    • Murray, Gina;
    • Kew, Kim;
    • Chuanzhen Zhou;
    • Russell, Josh;
    • Jones, Jacob L.;
    • Wingard, Christopher J.;
    • Barna, Barbara P.;
    • Thomassen, Mary Jane
    Publication type:
    Article
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    Spatial Signal Detection Using Continuous Shrinkage Priors.

    Published in:
    Technometrics, 2019, v. 61, n. 4, p. 494, doi. 10.1080/00401706.2018.1546622
    By:
    • Jhuang, An-Ting;
    • Fuentes, Montserrat;
    • Jones, Jacob L.;
    • Esteves, Giovanni;
    • Fancher, Chris M.;
    • Furman, Marschall;
    • Reich, Brian J.
    Publication type:
    Article
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    Origin of Ferroelectric Phase in Undoped HfO<sub>2</sub> Films Deposited by Sputtering.

    Published in:
    Advanced Materials Interfaces, 2019, v. 6, n. 20, p. N.PAG, doi. 10.1002/admi.201901528
    By:
    • Mittmann, Terence;
    • Materano, Monica;
    • Lomenzo, Patrick D.;
    • Park, Min Hyuk;
    • Stolichnov, Igor;
    • Cavalieri, Matteo;
    • Zhou, Chuanzhen;
    • Chung, Ching‐Chang;
    • Jones, Jacob L.;
    • Szyjka, Thomas;
    • Müller, Martina;
    • Kersch, Alfred;
    • Mikolajick, Thomas;
    • Schroeder, Uwe
    Publication type:
    Article
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    Origin of Ferroelectric Phase in Undoped HfO<sub>2</sub> Films Deposited by Sputtering.

    Published in:
    Advanced Materials Interfaces, 2019, v. 6, n. 11, p. N.PAG, doi. 10.1002/admi.201900042
    By:
    • Mittmann, Terence;
    • Materano, Monica;
    • Lomenzo, Patrick D.;
    • Park, Min Hyuk;
    • Stolichnov, Igor;
    • Cavalieri, Matteo;
    • Zhou, Chuanzhen;
    • Chung, Ching‐Chang;
    • Jones, Jacob L.;
    • Szyjka, Thomas;
    • Müller, Martina;
    • Kersch, Alfred;
    • Mikolajick, Thomas;
    • Schroeder, Uwe
    Publication type:
    Article
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