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Coherence and pulse duration characterization of the PAL-XFEL in the hard X-ray regime.
- Published in:
- Scientific Reports, 2019, v. 9, n. 1, p. 1, doi. 10.1038/s41598-019-39765-3
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Structural measurement of electron-phonon coupling and electronic thermal transport across a metal-semiconductor interface.
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- Scientific Reports, 2022, v. 12, n. 1, p. 1, doi. 10.1038/s41598-022-20715-5
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- Article
X-ray beam diagnostics at the MID instrument of the European X-ray Free-Electron Laser Facility.
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- Journal of Synchrotron Radiation, 2024, v. 31, n. 3, p. 596, doi. 10.1107/S1600577524001279
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- Article
Time-Resolved Structural Measurement of Thermal Resistance across a Buried Semiconductor Heterostructure Interface.
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- Materials (1996-1944), 2023, v. 16, n. 23, p. 7450, doi. 10.3390/ma16237450
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- Article
Probing Electronic Strain Generation by Separated Electron-Hole Pairs Using Time-Resolved X-ray Scattering.
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- Applied Sciences (2076-3417), 2019, v. 9, n. 22, p. 4788, doi. 10.3390/app9224788
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- Article
Reduced Thermal Conductivity in Ultrafast Laser Heated Silicon Measured by Time-Resolved X-ray Diffraction.
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- Crystals (2073-4352), 2021, v. 11, n. 2, p. 186, doi. 10.3390/cryst11020186
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- Article