Automated Identification of Application-Dependent Safe Faults in Automotive Systems-on-a-Chips.
- Published in:
- Electronics (2079-9292), 2022, v. 11, n. 3, p. 319, doi. 10.3390/electronics11030319
- By:
- Publication type:
- Article
Works matching AU Jenihhin, Maksim
Results: 8
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2
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors.
- Published in:
- 2020
- By:
- Publication type:
- Letter
3
Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits.
- Published in:
- Journal of Electronic Testing, 2016, v. 32, n. 3, p. 273, doi. 10.1007/s10836-016-5589-x
- By:
- Publication type:
- Article
4
On the Reuse of TLM Mutation Analysis at RTL.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 4, p. 435, doi. 10.1007/s10836-012-5303-6
- By:
- Publication type:
- Article
5
Identifying Untestable Faults in Sequential Circuits Using Test Path Constraints.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 4, p. 511, doi. 10.1007/s10836-012-5312-5
- By:
- Publication type:
- Article
6
PSL Assertion Checking Using Temporally Extended High-Level Decision Diagrams.
- Published in:
- Journal of Electronic Testing, 2009, v. 25, n. 6, p. 289, doi. 10.1007/s10836-009-5116-4
- By:
- Publication type:
- Article
7
Application of high-level decision diagrams for simulation-based verification tasks.
- Published in:
- Estonian Journal of Engineering, 2010, v. 16, n. 1, p. 56, doi. 10.3176/eng.2010.1.07
- By:
- Publication type:
- Article
8
A Survey on UAV Computing Platforms: A Hardware Reliability Perspective.
- Published in:
- Sensors (14248220), 2022, v. 22, n. 16, p. 6286, doi. 10.3390/s22166286
- By:
- Publication type:
- Article