Works by Jayavel, R.
1
- International Journal of Nanoscience, 2011, v. 10, n. 3, p. 441, doi. 10.1142/S0219581X11008204
- CHINNU, M. KARL;
- SARAVANAN, L.;
- JAYAVEL, R.;
- RAGHAVAN, C. M.;
- ANAND, K. VIJAI;
- KUMAR, R. MOHAN;
- ALAGESAN, T.
- Article
2
- International Journal of Nanoscience, 2011, v. 10, n. 3, p. 487, doi. 10.1142/S0219581X11008253
- ANAND, K. VIJAI;
- MOHAN, R.;
- KUMAR, R. MOHAN;
- CHINNU, M. KARL;
- JAYAVEL, R.
- Article
3
- Ferroelectrics, 1998, v. 215, n. 1, p. 169, doi. 10.1080/00150199808229560
- Varatharajan, R.;
- Jayavel, R.;
- Subramanian, C.
- Article
4
- Ferroelectrics, 1997, v. 200, n. 1, p. 279, doi. 10.1080/00150199708008612
- Aravazhi, S.;
- Jayavel, R.;
- Subramanian, C.
- Article
5
- Applied Physics A: Materials Science & Processing, 2002, v. 74, n. 6, p. s1667, doi. 10.1007/s003390201838
- Choudhury, R.-R.;
- Chitra, R.;
- Ramanadham, M.;
- Jayavel, R.
- Article
6
- Surface Review & Letters, 2006, v. 13, n. 6, p. 803, doi. 10.1142/S0218625X06008888
- SIDDHESWARAN, R.;
- SANKAR, R.;
- RATHNAKUMARI, M.;
- MURUGAKOOTHAN, P.;
- JAYAVEL, R.;
- SURESHKUMAR, P.
- Article
7
- Journal of Experimental Nanoscience, 2015, v. 10, n. 10, p. 787, doi. 10.1080/17458080.2014.902542
- Reghuram, S.;
- Arivarasan, A.;
- Kalpana, R.;
- Jayavel, R.
- Article
8
- Journal of Experimental Nanoscience, 2015, v. 10, n. 7, p. 520, doi. 10.1080/17458080.2013.845916
- Karl Chinnu, M.;
- Vijai Anand, K.;
- Mohan Kumar, R.;
- Alagesan, T.;
- Jayavel, R.
- Article
9
- Journal of Experimental Nanoscience, 2014, v. 9, n. 3, p. 261, doi. 10.1080/17458080.2012.656708
- Vijai Anand, K.;
- Mohan, R.;
- Mohan Kumar, R.;
- Karl Chinnu, M.;
- Jayavel, R.
- Article
10
- Journal of Electronic Materials, 2020, v. 49, n. 5, p. 3174, doi. 10.1007/s11664-020-08049-2
- Venkatachalam, V.;
- Jayavel, R.
- Article
11
- Journal of Materials Science: Materials in Electronics, 2024, v. 35, n. 27, p. 1, doi. 10.1007/s10854-024-13566-5
- Arunmetha, S.;
- Dhineshbabu, N. R.;
- Sakthipandi, K.;
- Jayavel, R.
- Article
12
- Journal of Materials Science: Materials in Electronics, 2023, v. 34, n. 12, p. 1, doi. 10.1007/s10854-023-10367-0
- Rajkumar, R.;
- Mani, J.;
- Radha, S.;
- Arivanandhan, M.;
- Jayavel, R.;
- Anbalagan, G.
- Article
13
- Journal of Materials Science: Materials in Electronics, 2022, v. 33, n. 29, p. 22785, doi. 10.1007/s10854-022-09046-3
- Jhansi, N.;
- Balasubramanian, D.;
- Raman, R.;
- Jayavel, R.
- Article
14
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 24, p. 28382, doi. 10.1007/s10854-021-07218-1
- Arunmetha, S.;
- Dhineshbabu, N. R.;
- Kumar, Atul;
- Jayavel, R.
- Article
15
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 3, p. 2744, doi. 10.1007/s10854-020-05007-w
- Muthamizh, S.;
- Yesuraj, J.;
- Jayavel, R.;
- Contreras, D.;
- Arul Varman, K.;
- Mangalaraja, R. V.
- Article
16
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 13794, doi. 10.1007/s10854-018-9510-5
- Article
17
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 14, p. 11738, doi. 10.1007/s10854-018-9272-0
- Nagarani, S.;
- Sasikala, G.;
- Satheesh, K.;
- Yuvaraj, M.;
- Jayavel, R.
- Article
18
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 7, p. 6059, doi. 10.1007/s10854-018-8580-8
- Venkatachalam, V.;
- Alsalme, A.;
- Alswieleh, A.;
- Jayavel, R.
- Article
19
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3074, doi. 10.1007/s10854-017-8239-x
- Jayachandiran, J.;
- Raja, A.;
- Arivanandhan, M.;
- Jayavel, R.;
- Nedumaran, D.
- Article
20
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 4653, doi. 10.1007/s10854-016-4343-6
- Vigneshwaran, P.;
- Kandiban, M.;
- Senthil Kumar, N.;
- Venkatachalam, V.;
- Jayavel, R.;
- Vetha Potheher, I.
- Article
21
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 8, p. 6319, doi. 10.1007/s10854-015-3219-5
- Thirumal, V.;
- Pandurangan, A.;
- Jayavel, R.;
- Venkatesh, K.;
- Palani, N.;
- Ragavan, R.;
- Ilangovan, R.
- Article
22
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 9, p. 3953, doi. 10.1007/s10854-014-2113-x
- Dhinesh Kumar, R.;
- Jayavel, R.
- Article
23
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 3, p. 1369, doi. 10.1007/s10854-014-1736-2
- Mohan Kumar, G.;
- Ilanchezhiyan, P.;
- Poongothai, S.;
- Park, Jinsub;
- Jayavel, R.
- Article
24
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 1, p. 529, doi. 10.1007/s10854-013-1620-5
- Vasudevan, R.;
- Karthik, T.;
- Selvakumar, D.;
- Ganesan, S.;
- Jayavel, R.
- Article
25
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 8, p. 2796, doi. 10.1007/s10854-013-1173-7
- Ilanchezhiyan, P.;
- Mohan Kumar, G.;
- Suresh, S.;
- Kang, Tae;
- Jayavel, R.
- Article
26
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 8, p. 2989, doi. 10.1007/s10854-013-1201-7
- Mohan Kumar, G.;
- Ilanchezhiyan, P.;
- Kawakita, Jin;
- Park, Jinsub;
- Jayavel, R.
- Article
27
- Inorganics, 2022, v. 10, n. 10, p. 169, doi. 10.3390/inorganics10100169
- Dutta, Vishal;
- Verma, Ritesh;
- Gopalkrishnan, C.;
- Yuan, Min-Hao;
- Batoo, Khalid Mujasam;
- Jayavel, R.;
- Chauhan, Ankush;
- Lin, Kun-Yi Andrew;
- Balasubramani, Ravindran;
- Ghotekar, Suresh
- Article
28
- Physica Status Solidi (B), 2007, v. 244, n. 2, p. 558, doi. 10.1002/pssb.200642439
- Gokul Raj, S.;
- Ramesh Kumar, G.;
- Mohan, R.;
- Jayavel, R.;
- Varghese, Babu
- Article
29
- Nanomaterials & Nanotechnology, 2011, v. 1, n. 2, p. 42
- Saravanan, L.;
- Diwakar, S.;
- Mohankumar, R.;
- Pandurangan, A.;
- Jayavel, R.
- Article
30
- Applied Physics A: Materials Science & Processing, 2023, v. 129, n. 2, p. 1, doi. 10.1007/s00339-022-06367-2
- Chauhan, Ankush;
- Verma, Ritesh;
- Krishnan, C. Gopal;
- Jayavel, R.;
- Batoo, Khalid Mujasam;
- Hussain, Sajjad;
- Kumar, Rajesh;
- Kumar, Pradeep
- Article
31
- Applied Physics A: Materials Science & Processing, 2013, v. 112, n. 3, p. 711, doi. 10.1007/s00339-013-7763-7
- Pandi, P.;
- Peramaiyan, G.;
- Mohan Kumar, R.;
- Bhagavannarayana, G.;
- Jayavel, R.
- Article
32
- Applied Physics A: Materials Science & Processing, 2012, v. 107, n. 1, p. 93, doi. 10.1007/s00339-011-6741-1
- Kalaiselvi, D.;
- Jayavel, R.
- Article
33
- Applied Physics A: Materials Science & Processing, 2006, v. 83, n. 1, p. 123, doi. 10.1007/s00339-005-3469-9
- Giridharan, N. V.;
- Subramanian, M.;
- Jayavel, R.
- Article
34
- Research on Chemical Intermediates, 2018, v. 44, n. 7, p. 4323, doi. 10.1007/s11164-018-3371-7
- Dhinesh Kumar, R.;
- Thangappan, R.;
- Jayavel, R.
- Article
35
- Journal of Thermal Analysis & Calorimetry, 2013, v. 114, n. 2, p. 845, doi. 10.1007/s10973-013-3064-9
- Parameshwaran, R.;
- Jayavel, R.;
- Kalaiselvam, S.
- Article
36
- Journal of Nanoparticle Research, 2011, v. 13, n. 4, p. 1621, doi. 10.1007/s11051-010-9915-4
- Saravanan, L.;
- Pandurangan, A.;
- Jayavel, R.
- Article
37
- Scientific Reports, 2019, v. 9, n. 1, p. N.PAG, doi. 10.1038/s41598-019-45408-4
- Selvakumar, D.;
- Sivaram, H.;
- Alsalme, A.;
- Alghamdi, A.;
- Jayavel, R.
- Article
38
- E-Journal of Chemistry, 2010, v. 7, n. 1, p. 137, doi. 10.1155/2010/903061
- Kanagadurai, R.;
- Durairajan, R.;
- Sankar, R.;
- Sivanesan, G.;
- Elangovan, S. P.;
- Jayavel, R.
- Article
39
- E-Journal of Chemistry, 2009, v. 6, n. 3, p. 871, doi. 10.1155/2009/459656
- Kanagadurai, R.;
- Durairajan, R.;
- Sankar, R.;
- Sivanesan, G.;
- Elangovan, S. P.;
- Jayavel, R.
- Article
40
- Journal of Nanoparticle Research, 2014, v. 16, n. 7, p. 1, doi. 10.1007/s11051-014-2501-4
- Dhinesh Kumar, R.;
- Subramanian, M.;
- Tanemura, M.;
- Jayavel, R.
- Article
41
- Crystal Research & Technology, 2013, v. 48, n. 1, p. 22, doi. 10.1002/crat.201200282
- Saravanan, R.;
- Rajesh, D.;
- Rajasekaran, S.V.;
- Perumal, R.;
- Chitra, M.;
- Jayavel, R.
- Article
42
- Crystal Research & Technology, 2012, v. 47, n. 5, p. 523, doi. 10.1002/crat.201100580
- Srimathy, B.;
- Jayavel, R.;
- Ganesamoorthy, S.;
- Bhaumik, I.;
- Karnal, A. K.;
- Natarajan, V.;
- Varadarajan, E.;
- Kumar, J.
- Article
43
- Crystal Research & Technology, 2008, v. 43, n. 4, p. 417, doi. 10.1002/crat.200711036
- S. Arjunan;
- R. Mohan Kumar;
- R. Mohan;
- R. Jayavel
- Article
44
- Crystal Research & Technology, 2006, v. 41, n. 9, p. 853, doi. 10.1002/crat.200510683
- Kanagadurai, R.;
- Sankar, R.;
- Sivanesan, G.;
- Srinivasan, S.;
- Jayavel, R.
- Article
45
- Crystal Research & Technology, 2006, v. 41, n. 9, p. 919, doi. 10.1002/crat.200510696
- Sankar, R.;
- Raghavan, C. M.;
- Jayavel, R.
- Article
46
- Crystal Research & Technology, 2006, v. 41, n. 8, p. 771
- R. Siddheswaran;
- R. Sankar;
- M. Rathnakumari;
- R. Jayavel;
- P. Murugakoothan
- Article
47
- Crystal Research & Technology, 2006, v. 41, n. 7, p. 712
- R. Sankar;
- S. Kalainathan;
- R. Jayavel;
- T. Irusan
- Article
48
- Crystal Research & Technology, 2006, v. 41, n. 5, p. 446
- R. Siddheswaran;
- R. Sankar;
- M. Ramesh Babu;
- M. Rathnakumari;
- R. Jayavel;
- P. Murugakoothan
- Article
49
- Crystal Research & Technology, 2001, v. 36, n. 1, p. 65, doi. 10.1002/1521-4079(200101)36:1<65::AID-CRAT65>3.0.CO;2-4
- Giridharan, N.V.;
- Jayavel, R.;
- Ramasamy, P.
- Article
50
- Crystal Research & Technology, 1999, v. 34, n. 10, p. 1265, doi. 10.1002/(SICI)1521-4079(199912)34:10<1265::AID-CRAT1265>3.0.CO;2-R
- Mohan Kumar, R.;
- Gopalakrishnan, N.;
- Jayavel, R.;
- Ramasamy, P.
- Article