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Quantitative thickness determination using x-ray fluorescence: application to multiple layers.
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- XRS: X-ray Spectrometry, 2004, v. 33, n. 5, p. 354, doi. 10.1002/xrs.729
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- Article
Near room temperature energy-dispersive detectors processed on high-purity silicon.
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- XRS: X-ray Spectrometry, 1995, v. 24, n. 2, p. 63, doi. 10.1002/xrs.1300240208
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- Article