Works matching AU Jaime-Vasquez, M.

Results: 30

Impurity ‘Hot Spots’ in MBE HgCdTe/CdZnTe.

Published in:

Journal of Electronic Materials, 2018, v. 47, n. 10, p. 5671, doi. 10.1007/s11664-018-6523-z

By:

Benson, J. D.;
Bubulac, L. O.;
Wang, A.;
Jacobs, R. N.;
Arias, J. M.;
Jaime-Vasquez, M.;
Smith, P. J.;
Almeida, L. A.;
Stoltz, A.;
Wijewarnasuriya, P. S.;
Yulius, A.;
Carmody, M.;
Reddy, M.;
Peterson, J.;
Johnson, S. M.;
Bangs, J.;
Lofgreen, D. D.

Publication type:

Article

Impact of CdZnTe Substrates on MBE HgCdTe Deposition.

Published in:

Journal of Electronic Materials, 2017, v. 46, n. 9, p. 5418, doi. 10.1007/s11664-017-5599-1

By:

Benson, J.;
Bubulac, L.;
Jaime-Vasquez, M.;
Arias, J.;
Smith, P.;
Jacobs, R.;
Markunas, J.;
Almeida, L.;
Stoltz, A.;
Wijewarnasuriya, P.;
Peterson, J.;
Reddy, M.;
Jones, K.;
Johnson, S.;
Lofgreen, D.

Publication type:

Article

Analysis of Etched CdZnTe Substrates.

Published in:

Journal of Electronic Materials, 2016, v. 45, n. 9, p. 4502, doi. 10.1007/s11664-016-4642-y

By:

Benson, J.;
Bubulac, L.;
Jaime-Vasquez, M.;
Lennon, C.;
Arias, J.;
Smith, P.;
Jacobs, R.;
Markunas, J.;
Almeida, L.;
Stoltz, A.;
Wijewarnasuriya, P.;
Peterson, J.;
Reddy, M.;
Jones, K.;
Johnson, S.;
Lofgreen, D.

Publication type:

Article

Dynamic Curvature and Stress Studies for MBE CdTe on Si and GaAs Substrates.

Published in:

Journal of Electronic Materials, 2015, v. 44, n. 9, p. 3076, doi. 10.1007/s11664-015-3822-5

By:

Jacobs, R.;
Jaime Vasquez, M.;
Lennon, C.;
Nozaki, C.;
Almeida, L.;
Pellegrino, J.;
Arias, J.;
Taylor, C.;
Wissman, B.

Publication type:

Article

As-Received CdZnTe Substrate Contamination.

Published in:

Journal of Electronic Materials, 2015, v. 44, n. 9, p. 3082, doi. 10.1007/s11664-015-3823-4

By:

Benson, J.;
Bubulac, L.;
Jaime-Vasquez, M.;
Lennon, C.;
Smith, P.;
Jacobs, R.;
Markunas, J.;
Almeida, L.;
Stoltz, A.;
Arias, J.;
Wijewarnasuriya, P.;
Peterson, J.;
Reddy, M.;
Vilela, M.;
Johnson, S.;
Lofgreen, D.;
Yulius, A.;
Carmody, M.;
Hirsch, R.;
Fiala, J.

Publication type:

Article

Impact of Tellurium Precipitates in CdZnTe Substrates on MBE HgCdTe Deposition.

Published in:

Journal of Electronic Materials, 2014, v. 43, n. 11, p. 3993, doi. 10.1007/s11664-014-3338-4

By:

Benson, J.;
Bubulac, L.;
Smith, P.;
Jacobs, R.;
Markunas, J.;
Jaime-Vasquez, M.;
Almeida, L.;
Stoltz, A.;
Wijewarnasuriya, P.;
Brill, G.;
Chen, Y.;
Peterson, J.;
Reddy, M.;
Vilela, M.;
Johnson, S.;
Lofgreen, D.;
Yulius, A.;
Bostrup, G.;
Carmody, M.;
Lee, D.

Publication type:

Article

A Review of the Characterization Techniques for the Analysis of Etch Processed Surfaces of HgCdTe and Related Compounds.

Published in:

Journal of Electronic Materials, 2014, v. 43, n. 9, p. 3708, doi. 10.1007/s11664-014-3281-4

By:

Stoltz, A.;
Benson, J.;
Jaime-Vasquez, M.;
Smith, P.;
Almeida, L.;
Jacobs, R.;
Markunas, J.;
Brogden, K.;
Brown, A.;
Lennon, C.;
Maloney, P.;
Supola, N.

Publication type:

Article

Variable-Field Hall Measurement and Transport in LW Single-Layer n-Type MBE HgCdTe.

Published in:

Journal of Electronic Materials, 2013, v. 42, n. 11, p. 3224, doi. 10.1007/s11664-013-2781-y

By:

Brown, A.;
Jaime-Vasquez, M.;
Almeida, L.;
Arias, J.;
Lennon, C.;
Jacobs, R.;
Pellegrino, J.;
Sivananthan, S.

Publication type:

Article

Impurity Gettering in (112)B HgCdTe/CdTe/Alternate Substrates.

Published in:

Journal of Electronic Materials, 2013, v. 42, n. 11, p. 3217, doi. 10.1007/s11664-013-2780-z

By:

Benson, J.;
Bubulac, L.;
Lennon, C.;
Jacobs, R.;
Smith, P.;
Markunas, J.;
Jaime-Vasquez, M.;
Almeida, L.;
Stoltz, A.;
Arias, J.;
Brill, G.;
Chen, Y.;
Wijewarnasuriya, P.;
Vilela, M.;
Peterson, J.;
Johnson, S.;
Lofgreen, D.;
Rhiger, D.;
Patten, E.;
Bangs, J.

Publication type:

Article

TEM Characterization of HgCdTe/CdTe Grown on GaAs(211)B Substrates.

Published in:

Journal of Electronic Materials, 2013, v. 42, n. 11, p. 3142, doi. 10.1007/s11664-013-2688-7

By:

Kim, Jae;
Jacobs, R.;
Almeida, L.;
Jaime-Vasquez, M.;
Nozaki, C.;
Smith, David

Publication type:

Article

Growth and Analysis of HgCdTe on Alternate Substrates.

Published in:

Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2971, doi. 10.1007/s11664-012-2089-3

By:

Benson, J.D.;
Bubulac, L.O.;
Smith, P.J.;
Jacobs, R.N.;
Markunas, J.K.;
Jaime-Vasquez, M.;
Almeida, L.A.;
Stoltz, A.;
Arias, J.M.;
Brill, G.;
Chen, Y.;
Wijewarnasuriya, P.S.;
Farrell, S.;
Lee, U.

Publication type:

Article

Understanding the Evolution of CdTe Buffer Layer Surfaces on ZnTe/Si(211) and GaAs(211)B During Cyclic Annealing.

Published in:

Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2975, doi. 10.1007/s11664-012-2169-4

By:

Jaime-Vasquez, M.;
Jacobs, R.N.;
Nozaki, C.;
Benson, J.D.;
Almeida, L.A.;
Arias, J.;
Pellegrino, J.

Publication type:

Article

Development of MBE II-VI Epilayers on GaAs(211)B.

Published in:

Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2707, doi. 10.1007/s11664-012-2218-z

By:

Jacobs, R.N.;
Nozaki, C.;
Almeida, L.A.;
Jaime-Vasquez, M.;
Lennon, C.;
Markunas, J.K.;
Benson, D.;
Smith, P.;
Zhao, W.F.;
Smith, D.J.;
Billman, C.;
Arias, J.;
Pellegrino, J.

Publication type:

Article

Microstructural Characterization of CdTe(211)B/ZnTe/Si(211) Heterostructures Grown by Molecular Beam Epitaxy.

Published in:

Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1733, doi. 10.1007/s11664-011-1673-2

By:

ZHAO, W.;
JACOBS, R.;
JAIME-VASQUEZ, M.;
BUBULAC, L.;
SMITH, DAVID

Publication type:

Article

Dislocation Analysis in (112)B HgCdTe/CdTe/Si.

Published in:

Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1847, doi. 10.1007/s11664-011-1670-5

By:

Benson, J.;
Farrell, S.;
Brill, G.;
Chen, Y.;
Wijewarnasuriya, P.;
Bubulac, L.;
Smith, P.;
Jacobs, R.;
Markunas, J.;
Jaime-Vasquez, M.;
Almeida, L.;
Stoltz, A.;
Lee, U.;
Vilela, M.;
Peterson, J.;
Johnson, S.;
Lofgreen, D.;
Rhiger, D.;
Patten, E.;
Goetz, P.

Publication type:

Article

The Distribution Tail of LWIR HgCdTe-on-Si FPAs: a Hypothetical Physical Mechanism.

Published in:

Journal of Electronic Materials, 2011, v. 40, n. 3, p. 280, doi. 10.1007/s11664-010-1505-9

By:

Bubulac, L.;
Benson, J.D.;
Jacobs, R.N.;
Stoltz, A.J.;
Jaime-Vasquez, M.;
Almeida, L.;
Wang, A.;
Wang, L.;
Hellmer, R.;
Golding, T.;
Dinan, J.H.;
Carmody, M.;
Wijewarnasuriya, P.S.;
Lee, M.F.;
Vilela, M.F.;
Peterson, J.;
Johnson, S.M.;
Lofgreen, D.F.;
Rhiger, D.

Publication type:

Article

Evaluation of Surface Cleaning of Si(211) for Molecular-Beam Epitaxy Deposition of Infrared Detectors.

Published in:

Journal of Electronic Materials, 2010, v. 39, n. 7, p. 951, doi. 10.1007/s11664-010-1152-1

By:

Jaime-Vasquez, M.;
Jacobs, R. N.;
Benson, J. D.;
Stoltz, A. J.;
Almeida, L. A.;
Bubulac, L. O.;
Chen, Y.;
Brill, G.

Publication type:

Article

Characterization of Dislocations in (112)B HgCdTe/CdTe/Si.

Published in:

Journal of Electronic Materials, 2010, v. 39, n. 7, p. 1080, doi. 10.1007/s11664-010-1262-9

By:

Benson, J. D.;
Bubulac, L. O.;
Smith, P. J.;
Jacobs, R. N.;
Markunas, J. K.;
Jaime-Vasquez, M.;
Almeida, L. A.;
Stoltz, A. J.;
Wijewarnasuriya, P. S.;
Brill, G.;
Chen, Y.;
Lee, U.;
Vilela, M. F.;
Peterson, J.;
Johnson, S. M.;
Lofgreen, D. D.;
Rhiger, D.;
Patten, E. A.;
Goetz, P. M.

Publication type:

Article

Topography and Dislocations in (112)B HgCdTe/CdTe/Si.

Published in:

Journal of Electronic Materials, 2009, v. 38, n. 8, p. 1771, doi. 10.1007/s11664-009-0758-7

By:

Benson, J. D.;
Smith, P. J.;
Jacobs, R. N.;
Markunas, J. K.;
Jaime-Vasquez, M.;
Almeida, L. A.;
Stoltz, A.;
Bubulac, L. O.;
Groenert, M.;
Wijewarnasuriya, P. S.;
Brill, G.;
Chen, Y.;
Lee, U.

Publication type:

Article

Relevance of Thermal Mismatch in Large-Area Composite Substrates for HgCdTe Heteroepitaxy.

Published in:

Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1480, doi. 10.1007/s11664-008-0519-z

By:

JACOBS, R. N.;
ALMEIDA, L. A.;
MARKUNAS, J.;
PELLEGRINO, J.;
GROENERT, M.;
JAIME-VASQUEZ, M.;
MAHADIK, N.;
ANDREWS, C.;
QADRI, S. B.;
LEE, T.;
KIM, M.

Publication type:

Article

Structural Analysis of CdTe Hetero-epitaxy on (211) Si.

Published in:

Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1231, doi. 10.1007/s11664-008-0469-5

By:

BENSON, J. D.;
JACOBS, R. N.;
MARKUNAS, J. K.;
JAIME-VASQUEZ, M.;
SMITH, P. J.;
ALMEIDA, L. A.;
MARTINKA, M.;
VILELA, M. F.;
LEE, U.

Publication type:

Article

Plasma-Cleaned InSb (112)B for Large-Area Epitaxy of HgCdTe Sensors.

Published in:

Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1247, doi. 10.1007/s11664-008-0460-1

By:

JAIME-VASQUEZ, M.;
MARTINKA, M.;
STOLTZ, A. J.;
JACOBS, R. N.;
BENSON, J. D.;
ALMEIDA, L. A.;
MARKUNAS, J. K.

Publication type:

Article

Nucleation of ZnTe on the As-Terminated Si(112) Surface.

Published in:

Journal of Electronic Materials, 2007, v. 36, n. 8, p. 905, doi. 10.1007/s11664-007-0128-2

By:

Jaime-Vasquez, M.;
Martinka, M.;
Jacobs, R. N.;
Benson, J. D.

Publication type:

Article

Effects of a-Si:H Resist Vacuum-Lithography Processing on HgCdTe.

Published in:

Journal of Electronic Materials, 2006, v. 35, n. 6, p. 1474, doi. 10.1007/s11664-006-0287-6

By:

Jacobs, R. N.;
Robinson, E. W.;
Jaime-Vasquez, M.;
Stoltz, A. J.;
Markunas, J.;
Almeida, L. A.;
Boyd, P. R.;
Dinan, J. H.;
Salamanca-Riba, L.

Publication type:

Article

Examination of the Effects of High-density Plasmas on the Surface of HgCdTe.

Published in:

Journal of Electronic Materials, 2006, v. 35, n. 6, p. 1461, doi. 10.1007/s11664-006-0284-9

By:

Stoltz, A. J.;
Jaime-Vasquez, M.;
Benson, J. D.;
Varesi, J. B.;
Martinka, M.

Publication type:

Article

In-situ Spectroscopic Study of the As and Te on the Si (112) Surface for High-quality Epitaxial Layers.

Published in:

Journal of Electronic Materials, 2006, v. 35, n. 6, p. 1455, doi. 10.1007/s11664-006-0283-x

By:

Jaime-Vasquez, M.;
Martinka, M.;
Jacobs, R. N.;
Groenert, M.

Publication type:

Article

Investigation of HgCdTe Surface Films and Their Removal.

Published in:

Journal of Electronic Materials, 2006, v. 35, n. 6, p. 1443, doi. 10.1007/s11664-006-0281-z

By:

Varesi, J. B.;
Benson, J. D.;
Jaime-Vasquez, M.;
Martinka, M.;
Stoltz, A. J.;
Dinan, H. H.

Publication type:

Article

Surface Structure of (111)A HgCdTe.

Published in:

Journal of Electronic Materials, 2006, v. 35, n. 6, p. 1434, doi. 10.1007/s11664-006-0280-0

By:

Benson, J. D.;
Varesi, J. B.;
Stoltz, A. J.;
Smith, E. P. G.;
Johnson, S. M.;
Jaime-Vasquez, M.;
Markunas, J. K.;
Almeida, L. A.;
Molstad, J. C.

Publication type:

Article

Spatially resolved microchemical analysis of chromate-conversion-coated aluminum alloy AA2024-T3.

Published in:

Surface & Interface Analysis: SIA, 2002, v. 33, n. 10/11, p. 796, doi. 10.1002/sia.1456

By:

Jaime Vasquez, M.;
Kearns, J. R.;
Halada, G. P.;
Clayton, C. R.

Publication type:

Article

On the nature of the chromate conversion coating formed on intermetallic constituents of AA2024-T3.

Published in:

Surface & Interface Analysis: SIA, 2002, v. 33, n. 7, p. 607, doi. 10.1002/sia.1428

By:

Jaime Vasquez, M.;
Halada, G. P.;
Clayton, C. R.;
Longtin, J. P.

Publication type:

Article