Shapes and Interfaces of Voids in III-V Compound Semiconductors.
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- Microscopy & Microanalysis, 2003, v. 9, p. 296, doi. 10.1017/S1431927603024127
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- Article
Works by Jäger, Ch.
Results: 3
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Polarity Determination of Sphalerite-type <110> and <001> Crystal Samples Using Simple Bragg-line Contrast Rules.
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- Microscopy & Microanalysis, 2003, v. 9, p. 94, doi. 10.1017/S143192760301328X
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- Article
3
Mesoporous silica-aluminas derived from precipitation: a study of the acidity, textural properties and catalytic performance.
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- Journal of Materials Science, 2009, v. 44, n. 24, p. 6629, doi. 10.1007/s10853-009-3580-y
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- Publication type:
- Article