Characterization of Er<sup>3+</sup> doped ZnTeTa semiconducting oxide glass.Published in:Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 9, p. 8920, doi. 10.1007/s10854-019-01220-4By:Kilic, Gökhan;Issever, Ugur Gökhan;Ilik, ErkanPublication type:Article