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Erratum to: Determination of the Electrical Resistivity of Vertically Aligned Carbon Nanotubes by Scanning Probe Microscopy.
- Published in:
- 2022
- By:
- Publication type:
- Correction Notice
The Influence of the PECVD Parameters on the Growth of Carbon Nanotubes for Nanopiezotronic Devices.
- Published in:
- Technical Physics, 2022, v. 67, n. 1, p. 34, doi. 10.1134/S1063784222010121
- By:
- Publication type:
- Article
Erratum to: Determination of the Electrical Resistivity of Vertically Aligned Carbon Nanotubes by Scanning Probe Microscopy.
- Published in:
- 2021
- By:
- Publication type:
- Correction Notice
Nonuniform Elastic Strain and Memristive Effect in Aligned Carbon Nanotubes.
- Published in:
- Technical Physics, 2018, v. 63, n. 11, p. 1672, doi. 10.1134/S1063784218110129
- By:
- Publication type:
- Article
Memristor effect on bundles of vertically aligned carbon nanotubes tested by scanning tunnel microscopy.
- Published in:
- Technical Physics, 2013, v. 58, n. 12, p. 1831, doi. 10.1134/S1063784213120025
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- Publication type:
- Article