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Design on Formation of Nickel Silicide by a Low‐Temperature Pulsed Laser Annealing Method to Reduce Contact Resistance for CMOS Inverter and 6T‐SRAM on a Wafer‐Scale Flexible Substrate.
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- Advanced Electronic Materials, 2023, v. 9, n. 12, p. 1, doi. 10.1002/aelm.202300353
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- Article
Improving the High-Temperature Gate Bias Instabilities by a Low Thermal Budget Gate-First Process in p-GaN Gate HEMTs.
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- Micromachines, 2023, v. 14, n. 3, p. 576, doi. 10.3390/mi14030576
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- Article
Integrated metasurfaces on silicon photonics for emission shaping and holographic projection.
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- Nanophotonics (21928606), 2022, v. 11, n. 21, p. 4687, doi. 10.1515/nanoph-2022-0344
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- Article
Device Characteristics of E-mode GaN HEMTs with a Second Gate Connected to the Source.
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- Journal of Electronic Materials, 2020, v. 49, n. 11, p. 6776, doi. 10.1007/s11664-020-08292-7
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- Article
How consumers respond to missing a quantity discount with multiple price breaks.
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- Journal of Consumer Behaviour, 2016, v. 15, n. 5, p. 411, doi. 10.1002/cb.1577
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- Article
Investor regret: The role of expectation in comparing what is to what might have been.
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- Judgment & Decision Making, 2012, v. 7, n. 4, p. 441, doi. 10.1017/s1930297500002771
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- Article
Attributions and Outcomes of Customer Misbehavior.
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- Journal of Business & Psychology, 2010, v. 25, n. 1, p. 151, doi. 10.1007/s10869-009-9137-x
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- Article
The influence of unawareness set and order effects in consumer regret.
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- Journal of Business & Psychology, 2006, v. 21, n. 2, p. 293, doi. 10.1007/s10869-006-9030-9
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- Article