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Improving Data Quality in Traditional Low‐Dose Scanning Transmission Electron Microscopy Imaging.
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- Particle & Particle Systems Characterization, 2023, v. 40, n. 1, p. 1, doi. 10.1002/ppsc.202200122
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- Article
Evaluation of automated particle picking for cryogenic electron microscopy using high‐precision transmission electron microscope simulation based on a multi‐slice method.
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- Acta Crystallographica: Section D, Structural Biology, 2021, v. 77, n. 7, p. 966, doi. 10.1107/S2059798321005106
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- Article
Evaluation of Automated Particle Picking for Cryo-EM Using High Precision TEM Simulation by Utilizing a Multi-slice Method.
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- 2020
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- Abstract
Evaluation of Automated Particle Picking for Cryo-EM Using High Precision TEM Simulation by Utilizing a Multi-slice Method.
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- 2020
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- Abstract
Evaluation of residual aberration in fifth-order geometrical aberration correctors.
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- Microscopy, 2018, v. 67, n. 3, p. 156, doi. 10.1093/jmicro/dfy009
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- Article
Phase-contrast scanning transmission electron microscopy.
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- Microscopy, 2015, v. 64, n. 3, p. 181, doi. 10.1093/jmicro/dfv011
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- Article
Resolving 45-pm-separated Si-Si atomic columns with an aberration-corrected STEM.
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- Microscopy, 2015, v. 64, n. 3, p. 213, doi. 10.1093/jmicro/dfv014
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- Article
First Demonstration of Phase Contrast Scanning Transmission Electron Microscopy.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 224, doi. 10.1017/S1431927614002840
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- Article
Development of Cs and Cc correctors for transmission electron microscopy.
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- Microscopy, 2013, v. 62, n. 1, p. 23, doi. 10.1093/jmicro/dfs134
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- Article
Direct imaging of hydrogen-atom columns in a crystal by annular bright-field electron microscopy.
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- Nature Materials, 2011, v. 10, n. 4, p. 278, doi. 10.1038/nmat2957
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- Article
Direct imaging of lithium atoms in LiV2O4 by spherical aberration-corrected electron microscopy.
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- Journal of Electron Microscopy, 2010, v. 59, n. 6, p. 457
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- Article
Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun.
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- Journal of Electron Microscopy, 2010, v. 59, n. S1, p. S7, doi. 10.1093/jmicro/dfq027
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- Article
Correction of higher order geometrical aberration by triple 3-fold astigmatism field.
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- Journal of Electron Microscopy, 2009, v. 58, n. 6, p. 341, doi. 10.1093/jmicro/dfp033
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- Article
STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun.
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- Journal of Electron Microscopy, 2009, v. 58, n. 6, p. 357, doi. 10.1093/jmicro/dfp030
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- Article
Ultrahigh-Vacuum Third-Order Spherical Aberration ~Cs! Corrector for a Scanning Transmission Electron Microscope.
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- Microscopy & Microanalysis, 2006, v. 12, n. 6, p. 456, doi. 10.1017/S1431927606060661
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- Article
Transfer doublet and an elaborated phase plate holder for 120 kV electron-phase microscope.
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- Journal of Electron Microscopy, 2005, v. 54, n. 4, p. 317
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- Article
A spherical aberration‐corrected 200 kV TEM.
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- Journal of Electron Microscopy, 2003, v. 52, n. 1, p. 3, doi. 10.1093/jmicro/52.1.3
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- Article