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Atomic Structural Analysis of Nanowire Defects and Polytypes Enabled Through Cross-Sectional Lattice Imaging.
- Published in:
- Small, 2012, v. 8, n. 11, p. 1717, doi. 10.1002/smll.201102404
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- Publication type:
- Article
Direct measurement of dopant distribution in an individual vapour–liquid–solid nanowire.
- Published in:
- Nature Nanotechnology, 2009, v. 4, n. 5, p. 315, doi. 10.1038/nnano.2009.51
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- Article
High-resolution detection of Au catalyst atoms in Si nanowires.
- Published in:
- Nature Nanotechnology, 2008, v. 3, n. 3, p. 168, doi. 10.1038/nnano.2008.5
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- Article
Nonuniform Nanowire Doping Profiles Revealed by Quantitative Scanning Photocurrent Microscopy.
- Published in:
- Advanced Materials, 2009, v. 21, n. 30, p. 3067, doi. 10.1002/adma.200803865
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- Publication type:
- Article
A Method for Directly Correlating Site-Specific Cross-Sectional and Plan-View Transmission Electron Microscopy of Individual Nanostructures.
- Published in:
- Microscopy & Microanalysis, 2012, v. 18, n. 6, p. 1410, doi. 10.1017/S1431927612013517
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- Publication type:
- Article
3D Complete-Tilt Electron Tomography of Semiconductor Nanowires.
- Published in:
- 2010
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- Publication type:
- Abstract