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Invariant embedding approach for electron probe microanalysis. Tilt factor, atomic number and energy of the incident electrons.
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- XRS: X-ray Spectrometry, 2005, v. 34, n. 3, p. 230, doi. 10.1002/xrs.801
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Thin-film characterization with x-ray microanalysis. Extending and improving invariant embedding results.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 2, p. 148, doi. 10.1002/xrs.629
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Application of the invariant embedding method to x-ray microanalysis.
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- XRS: X-ray Spectrometry, 1998, v. 27, n. 6, p. 390, doi. 10.1002/(SICI)1097-4539(199811/12)27:6<390::AID-XRS285>3.0.CO;2-U
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