S9000X - Next Generation of Ultra-High Resolution SEM for Enhanced Analysis and Xe Plasma FIB for Ultra-Fast and Gentle Sputtering.
- Published in:
- 2019
- By:
- Publication type:
- Abstract
Works by Havelka, Miloslav
Results: 8
1
2
Use of Focused Ion Beam as a Sample Preparation Tool for Cryo-Electron Tomography.
- Published in:
- 2019
- By:
- Publication type:
- Abstract
3
Detection Systems of Ultra-High-Resolution SEMs.
- Published in:
- 2019
- By:
- Publication type:
- Abstract
4
S9000X - Next Generation of Ultra-High Resolution SEM for Enhanced Analysis and Xe Plasma FIB for Ultra-Fast and Gentle Sputtering.
- Published in:
- 2018
- By:
- Publication type:
- Abstract
5
Use of Focused Ion Beam as a Sample Preparation Tool for Cryo-Electron Tomography.
- Published in:
- 2018
- By:
- Publication type:
- Abstract
6
Detection Systems of Ultra-High-Resolution SEMs.
- Published in:
- 2018
- By:
- Publication type:
- Abstract
7
New High-Resolution Low-Voltage and High Performance Analytical FIB/SEM System.
- Published in:
- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 1104, doi. 10.1017/S1431927614007247
- By:
- Publication type:
- Article
8
FIB-SEM Instrument with Integrated Raman Spectroscopy for Correlative Microscopy.
- Published in:
- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 990, doi. 10.1017/S1431927614006679
- By:
- Publication type:
- Article