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Track technology for creating the arrays of nickel microtips, micronozzles, and microtubes.
- Published in:
- Technical Physics Letters, 2009, v. 35, n. 7, p. 678, doi. 10.1134/S1063785009070268
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- Article
Visualization of the Ion Projected Range Region in GaAs Irradiated with Argon Ions.
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- Technical Physics Letters, 2000, v. 26, n. 1, p. 75, doi. 10.1134/1.1262746
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- Article
Low-temperature photoluminescence of heavy-ion-implanted InGaP solid solutions.
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- Technical Physics Letters, 1998, v. 24, n. 9, p. 690, doi. 10.1134/1.1262246
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- Article
Submicron source of free electrons.
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- Technical Physics, 2015, v. 60, n. 3, p. 447, doi. 10.1134/S106378421503007X
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- Article
Formation of Desired Concentration Profiles of Embedded Atoms and Radiation-Induced Defects by Using Monochromatic Fast Ion Beams.
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- Technical Physics, 2002, v. 47, n. 5, p. 578, doi. 10.1134/1.1479986
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- Article
Deep Levels in the Band Gap of GaN Layers Irradiated with Protons.
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- Semiconductors, 2002, v. 36, n. 12, p. 1352, doi. 10.1134/1.1529245
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- Article
Influence of oxygen on the photoluminescence intensity of erbium (at 1.54 μm) in erbium-doped a-Si:H films.
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- Semiconductors, 1998, v. 32, n. 11, p. 1234, doi. 10.1134/1.1187597
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- Article