Surface Passivation for Reliable Measurement of Bulk Electronic Properties of Heterojunction Devices.
- Published in:
- Small, 2016, v. 12, n. 38, p. 5339, doi. 10.1002/smll.201601575
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- Publication type:
- Article
Works by Guerra‐Nunez, Carlos
Results: 2
1
2
Thin-Film Engineering of Mechanical Fragmentation Properties of Atomic-Layer-Deposited Metal Oxides.
- Published in:
- Nanomaterials (2079-4991), 2020, v. 10, n. 3, p. 558, doi. 10.3390/nano10030558
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- Publication type:
- Article