Works by Guazzelli, Marcilei A.
Results: 4
Single-Event Burnout in Semiconductor Devices: Efficient Classification of Ion Species.
- Published in:
- Journal of Integrated Circuits & Systems, 2024, v. 19, n. 3, p. 1, doi. 10.29292/jics.v19i3.933
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- Article
Testing a Fault Tolerant Mixed-Signal Design Under TID and Heavy Ions.
- Published in:
- Journal of Integrated Circuits & Systems, 2021, v. 16, n. 3, p. 1, doi. 10.29292/jics.v16i3.567
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- Article
Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 4, p. 409, doi. 10.1007/s10836-023-06072-9
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- Article
Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs.
- Published in:
- Journal of Electronic Testing, 2021, v. 37, n. 3, p. 329, doi. 10.1007/s10836-021-05952-2
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- Article