Structural, morphologic and optical characterization of InAlS.
- Published in:
- Applied Physics A: Materials Science & Processing, 2014, v. 116, n. 4, p. 2011, doi. 10.1007/s00339-014-8387-2
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- Publication type:
- Article
Works by Guasch, C.
Results: 2
1
2
Conductive atomic force microscopy as a tool to reveal high ionising dose effects on ultra thin SiO/Si structures.
- Published in:
- Applied Nanoscience, 2013, v. 3, n. 3, p. 235, doi. 10.1007/s13204-012-0126-4
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- Publication type:
- Article