Found: 2
Select item for more details and to access through your institution.
Conductive atomic force microscopy as a tool to reveal high ionising dose effects on ultra thin SiO/Si structures.
- Published in:
- Applied Nanoscience, 2013, v. 3, n. 3, p. 235, doi. 10.1007/s13204-012-0126-4
- By:
- Publication type:
- Article
Structural, morphologic and optical characterization of InAlS.
- Published in:
- Applied Physics A: Materials Science & Processing, 2014, v. 116, n. 4, p. 2011, doi. 10.1007/s00339-014-8387-2
- By:
- Publication type:
- Article