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Investigating the Joint Amplitude and Phase Imaging of Stained Samples in Automatic Diagnosis.
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- Sensors (14248220), 2023, v. 23, n. 18, p. 7932, doi. 10.3390/s23187932
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A Physics-Inspired Deep Learning Framework for an Efficient Fourier Ptychographic Microscopy Reconstruction under Low Overlap Conditions.
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- Sensors (14248220), 2023, v. 23, n. 15, p. 6829, doi. 10.3390/s23156829
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- Article