Works matching AU Gorbenko, O. M.
Results: 8
The Formation of Developed Morphology on the Indium Phosphide Surface by Ion Argon Beam Sputtering.
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- Technical Physics, 2001, v. 46, n. 7, p. 892, doi. 10.1134/1.1387553
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Structural and Optical Properties of Heterostructures with InAs Quantum Dots in an InGaAsN Quantum Well Grown by Molecular-Beam Epitaxy.
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- Semiconductors, 2004, v. 38, n. 3, p. 340, doi. 10.1134/1.1682340
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Composition Analysis of Coherent Nanoinsertions of Solid Solutions on the Basis of High-Resolution Electron Micrographs.
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- Semiconductors, 2001, v. 35, n. 3, p. 347, doi. 10.1134/1.1356160
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Investigation of Surface Morphology of Copper-Modified Amorphous Carbon Films.
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- Semiconductors, 2001, v. 35, n. 2, p. 230, doi. 10.1134/1.1349938
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Scanning Tunneling Microscopy of Films of Amorphous Carbon Doped with Copper.
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- Semiconductors, 2000, v. 34, n. 2, p. 217, doi. 10.1134/1.1187935
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- Article
Nanostructured InSiAs Solid Solution Grown by Molecular Beam Epitaxy on the Si(001) Surface.
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- Technical Physics Letters, 2000, v. 26, n. 9, p. 781, doi. 10.1134/1.1315492
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Behavioral Features of the Approach Curve of a Scanning Ion-Conductance Microscope.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2023, v. 17, n. 3, p. 585, doi. 10.1134/S1027451023030096
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On the Spatial Resolution of a Piezoresonance Probe Sensor with a Tungsten Needle.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2023, v. 17, n. 3, p. 578, doi. 10.1134/S1027451023030059
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