Found: 7
Select item for more details and to access through your institution.
Estimating Low-Temperature RTS Rate in MCT FPA Through High-Temperature Noise Measurements.
- Published in:
- Journal of Electronic Materials, 2024, v. 53, n. 10, p. 5813, doi. 10.1007/s11664-024-11067-z
- By:
- Publication type:
- Article
Radiation Damage on Silicon Photomultipliers from Ionizing and Non-Ionizing Radiation of Low-Earth Orbit Operations.
- Published in:
- Sensors (14248220), 2024, v. 24, n. 15, p. 4990, doi. 10.3390/s24154990
- By:
- Publication type:
- Article
Development of a Charge-Multiplication CMOS Image Sensor Based on Capacitive Trench for Low-Light-Level Imaging.
- Published in:
- Sensors (14248220), 2023, v. 23, n. 23, p. 9518, doi. 10.3390/s23239518
- By:
- Publication type:
- Article
Evaluation of Microlenses, Color Filters, and Polarizing Filters in CIS for Space Applications.
- Published in:
- Sensors (14248220), 2023, v. 23, n. 13, p. 5884, doi. 10.3390/s23135884
- By:
- Publication type:
- Article
Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage.
- Published in:
- Sensors (14248220), 2019, v. 19, n. 24, p. 5550, doi. 10.3390/s19245550
- By:
- Publication type:
- Article
CMOS Image Sensors and Plasma Processes: How PMD Nitride Charging Acts on the Dark Current.
- Published in:
- Sensors (14248220), 2019, v. 19, n. 24, p. 5534, doi. 10.3390/s19245534
- By:
- Publication type:
- Article
Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors †.
- Published in:
- Sensors (14248220), 2019, v. 19, n. 24, p. 5447, doi. 10.3390/s19245447
- By:
- Publication type:
- Article