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A novel method to ascertain sample mass thickness and matrix effects for X-ray fluorescence element determinations.
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- XRS: X-ray Spectrometry, 1994, v. 23, n. 4, p. 160, doi. 10.1002/xrs.1300230405
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- Article
High-precision non-destructive x-ray fluorescence method applicable to establishing the provenance of obsidian artifacts.
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- XRS: X-ray Spectrometry, 1993, v. 22, n. 1, p. 44, doi. 10.1002/xrs.1300220111
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- Article