Found: 2
Select item for more details and to access through your institution.
Error Correction Schemes with Erasure Information for Fast Memories.
- Published in:
- Journal of Electronic Testing, 2014, v. 30, n. 2, p. 183, doi. 10.1007/s10836-014-5440-1
- By:
- Publication type:
- Article
Memory Reliability Improvement Based on Maximized Error-Correcting Codes.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 601, doi. 10.1007/s10836-013-5396-6
- By:
- Publication type:
- Article