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Mid-Infrared (MIR) Complex Refractive Index Spectra of Polycrystalline Copper-Nitride Films by IR-VASE Ellipsometry and Their FIB-SEM Porosity.
- Published in:
- Coatings (2079-6412), 2024, v. 14, n. 1, p. 5, doi. 10.3390/coatings14010005
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- Article