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Diffraction Dilatometry of Polymethacrylate at Low Temperatures.
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- Optics & Spectroscopy, 2018, v. 124, n. 3, p. 424, doi. 10.1134/S0030400X18030098
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- Article
Dynamic thermometry of a solid via optical diffraction method at pulsed irradiation.
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- Optics & Spectroscopy, 2009, v. 107, n. 4, p. 640, doi. 10.1134/S0030400X0910018X
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- Article
Formation of Periodic Diffraction Structures at Semiconductor Surfaces for Studying the Dynamics of Photoinduced Phase Transitions.
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- Optics & Spectroscopy, 2000, v. 89, n. 1, p. 136, doi. 10.1134/BF03356003
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- Article
Formation of a two-dimensional periodic structure of local melting regions on a silicon surface upon pulsed light irradiation.
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- Technical Physics, 1997, v. 42, n. 12, p. 1457, doi. 10.1134/1.1258902
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- Article
Dynamics of Nonequilibrium Gratings Induced in Silicon Films by Femtosecond Laser Pulses.
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- Semiconductors, 2001, v. 35, n. 12, p. 1366, doi. 10.1134/1.1427971
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- Article
Study of porous silicon obtained by krypton ion implantation and laser annealing.
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- Semiconductors, 1997, v. 31, n. 9, p. 970, doi. 10.1134/1.1187144
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- Article
Characteristic features of Raman scattering of light in silicon doped with high krypton doses.
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- Semiconductors, 1997, v. 31, n. 7, p. 669, doi. 10.1134/1.1187062
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- Article
An Optical Diffraction Method for Controlling the Solid-Phase Recrystallization and Heating of Implanted Semiconductors during Pulse Light Annealing.
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- Instruments & Experimental Techniques, 2019, v. 62, n. 2, p. 226, doi. 10.1134/S0020441219020076
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- Article
Development of the technique of laser diagnostics of solids under pulsed optical irradiation.
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- Instruments & Experimental Techniques, 2010, v. 53, n. 4, p. 607, doi. 10.1134/S002044121004024X
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- Article