Towards Low-Damage TEM Sample Preparation of Carbonaceous Materials in the Focused Ion Beam.
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- Microscopy & Microanalysis, 2009, v. 15, n. S2, p. 342, doi. 10.1017/S143192760909878X
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- Publication type:
- Article
Works by Fischione, PE
Results: 3
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2
Automated Sample Preparation of Nanoscale Devices for FESEM.
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- Microscopy & Microanalysis, 2009, v. 15, n. S2, p. 1076, doi. 10.1017/S1431927609098651
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- Publication type:
- Article
3
Nanomilling for Aberration – Corrected TEM and HAADF STEM.
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- Microscopy & Microanalysis, 2009, v. 15, n. S2, p. 348, doi. 10.1017/S1431927609098420
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- Publication type:
- Article