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Nanocrystalline Silicon Films Formed under the Impact of Pulsed Excimer Laser Radiation on Polyimide Substrates.
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- Technical Physics Letters, 2003, v. 29, n. 7, p. 569, doi. 10.1134/1.1598552
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- Article
Redistribution of Erbium and Oxygen Recoil Atoms and the Structure of Silicon Thin Surface Layers Formed by High-Dose Argon Implantation through Er and SiO<sub>2</sub> Surface Films.
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- Semiconductors, 2018, v. 52, n. 13, p. 1696, doi. 10.1134/S1063782618130055
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- Article
Precipitation of boron in silicon on high-dose implantation.
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- Semiconductors, 2010, v. 44, n. 3, p. 285, doi. 10.1134/S1063782610030024
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- Article
CVD SYNTHESIS AND THE STRUCTURE OF VERTICALLY ALIGNED CNT ARRAYS.
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- Journal of Structural Chemistry, 2022, v. 63, n. 7, p. 1145, doi. 10.1134/S0022476622070095
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- Article
Recombination of Point Defects and Their Interaction with the Surface in the Course of the Clusterization of these Defects in Si.
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- Semiconductors, 2001, v. 35, n. 9, p. 1072, doi. 10.1134/1.1403572
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- Article
Structural Transformations of the Dislocation Cores in Si and Their Relationship with Photoluminescence.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 636, doi. 10.1134/S1063774521040064
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- Article
Extended Defects in O+-Implanted Si Layers and Their Luminescence.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 625, doi. 10.1134/S1063774521040210
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- Article
In Situ Reflection Electron Microscopy for the Analysis of Silicon Surface Processes: Sublimation, Electromigration, and Adsorption of Impurity Atoms.
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- Crystallography Reports, 2021, v. 66, n. 4, p. 570, doi. 10.1134/S1063774521040192
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- Article
Photoluminescence associated with {113} defects in oxygen-implanted silicon.
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- Physica Status Solidi. A: Applications & Materials Science, 2017, v. 214, n. 7, p. n/a, doi. 10.1002/pssa.201700317
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- Article
Instability of the Distribution of Atomic Steps on Si(111) upon Submonolayer Gold Adsorption at High Temperatures.
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- JETP Letters, 2005, v. 81, n. 3, p. 117, doi. 10.1134/1.1898002
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- Article
Influence of the Structural Parameters of Triple Junctions of Special Grain Boundaries on Their Recombination Activity.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2021, v. 15, n. 1, p. S1, doi. 10.1134/S1027451022020082
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- Article