Found: 8
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Multi-beam X-ray ptychography using coded probes for rapid non-destructive high resolution imaging of extended samples.
- Published in:
- Scientific Reports, 2022, v. 12, n. 1, p. 1, doi. 10.1038/s41598-022-09466-5
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- Publication type:
- Article
Hard X-ray In-situ Full-field Microscopy for Material Science Applications.
- Published in:
- 2018
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- Publication type:
- Abstract
CRL optics and silicon drift detector for P06 Microprobe experiments at 35 keV — ERRATUM.
- Published in:
- 2021
- By:
- Publication type:
- Correction Notice
CRL optics and silicon drift detector for P06 Microprobe experiments at 35 keV.
- Published in:
- Powder Diffraction, 2020, v. 35, n. S1, p. S34, doi. 10.1017/S0885715620000536
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- Publication type:
- Article
High-energy interference-free K-lines synchrotron X-ray fluorescence microscopy of rare earth elements in hyperaccumulator plants.
- Published in:
- Metallomics, 2023, v. 15, n. 9, p. 1, doi. 10.1093/mtomcs/mfad050
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- Article
Flexible Plenoptic X-ray Microscopy.
- Published in:
- Photonics, 2022, v. 9, n. 2, p. 98, doi. 10.3390/photonics9020098
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- Publication type:
- Article
Apochromatic X-ray focusing.
- Published in:
- Light: Science & Applications, 2023, v. 12, n. 1, p. 1, doi. 10.1038/s41377-023-01157-8
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- Publication type:
- Article
X-ray diffraction with micrometre spatial resolution for highly absorbing samples.
- Published in:
- Journal of Synchrotron Radiation, 2022, v. 29, n. 6, p. 1407, doi. 10.1107/S1600577522008025
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- Publication type:
- Article