A parameters reduction method for monitoring multiple linear regression profiles.
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- International Journal of Advanced Manufacturing Technology, 2012, v. 58, n. 5-8, p. 621, doi. 10.1007/s00170-011-3406-3
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Works matching AU Eyvazian, Majid
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Monitoring process variability using exponentially weighted moving sample variance control charts.
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- International Journal of Advanced Manufacturing Technology, 2008, v. 39, n. 3/4, p. 261, doi. 10.1007/s00170-007-1213-7
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Monitoring process variability using exponentially weighted moving sample variance control charts.
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- 2008
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