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Annealing‐Induced Chemical Interaction at the Ag/In<sub>2</sub>O<sub>3</sub>:H Interface as Revealed by In Situ Photoelectron Spectroscopy.
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- Advanced Materials Interfaces, 2023, v. 10, n. 11, p. 1, doi. 10.1002/admi.202202347
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Crystallisation Phenomena of In2O3:H Films.
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- Materials (1996-1944), 2019, v. 12, n. 2, p. 266, doi. 10.3390/ma12020266
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- Article