Found: 15
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Investigation of neurotrophic factor concentrations with a novel in vitro concept for peripheral nerve regeneration.
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- Journal of Neuroscience Research, 2015, v. 93, n. 11, p. 1631, doi. 10.1002/jnr.23598
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AFM-Tip-Integrated Amperometric Microbiosensors: High-Resolution Imaging of Membrane TransportThis work is supported by NSF (grant 0216368) within the program “Biocomplexity in the Environment”, the National Institute of Health (grant EB000508), and the “Fonds zur Förderung der wissenschaftlichen Forschung” Austria (grants P14122-CHE and J2230). PCT patent on this technology: WO0194877A1.
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- Angewandte Chemie, 2005, v. 117, n. 22, p. 3485, doi. 10.1002/ange.200461556
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Simultane topographische und elektrochemische Abbildung von Enzymaktivität mit integrierten AFM-SECM-Rasternahfeldsonden im AFM-Tapping-Modus ( Diese Arbeit wurde von der NSF (Projekt 0216368 im Programm Biocomplexity in the Environment), der Max Kade Foundation und dem österreichischen Fonds zur Förderung der wissenschaftlichen Forschung (Projekte P14122-CHE und J2230) unterstützt. Die hier beschriebene Technik ist Gegenstand der PCT-Patentanmeldungen WO2001094877A1 und WO2001094926A1. )
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- Angewandte Chemie, 2003, v. 115, n. 28, p. 3358, doi. 10.1002/ange.200351111
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Electroluminescence from NiSi<sub>2</sub>/Si/NiSi<sub>2</sub> nanowire heterostructures operated at high electric fields.
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- Physica Status Solidi. A: Applications & Materials Science, 2016, v. 213, n. 11, p. 2895, doi. 10.1002/pssa.201600370
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Electroluminescence from NiSi<sub>2</sub>/Si/NiSi<sub>2</sub> nanowire heterostructures operated at high electric fields (Phys. Status Solidi A 11∕2016).
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- Physica Status Solidi. A: Applications & Materials Science, 2016, v. 213, n. 11, p. 2789, doi. 10.1002/pssa.201670671
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Magnetic force microscopy study of shape engineered FEBID iron nanostructures.
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- Physica Status Solidi. A: Applications & Materials Science, 2014, v. 211, n. 2, p. 368, doi. 10.1002/pssa.201330114
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Mask-free prototyping of metal-oxide-semiconductor devices utilizing focused electron beam induced deposition.
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- Physica Status Solidi. A: Applications & Materials Science, 2014, v. 211, n. 2, p. 375, doi. 10.1002/pssa.201330133
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Miniaturized Wide-Range Field-Emission Vacuum Gauge.
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- Nanomaterials & Nanotechnology, 2014, v. 4, p. 1, doi. 10.5772/59483
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III-V semiconductor nanocrystal formation in silicon nanowires via liquid-phase epitaxy.
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- Nano Research, 2014, v. 7, n. 12, p. 1769, doi. 10.1007/s12274-014-0536-6
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Highly conductive and pure gold nanostructures grown by electron beam induced deposition.
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- Scientific Reports, 2016, p. 34003, doi. 10.1038/srep34003
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Porous Silica-Based Mixed Oxides with Basic Organic Sites.
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- European Journal of Inorganic Chemistry, 2012, v. 2012, n. 32, p. 5207, doi. 10.1002/ejic.201200088
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Fabrication of a ring nanoelectrode in an AFM tip: novel approach towards simultaneous electrochemical and topographical imaging.
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- Surface & Interface Analysis: SIA, 2002, v. 33, n. 2, p. 146, doi. 10.1002/sia.1178
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Impact of growth temperature on the crystal habits, forms and structures of VO nanocrystals.
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- Applied Physics A: Materials Science & Processing, 2011, v. 102, n. 1, p. 201, doi. 10.1007/s00339-010-5940-5
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- Article
AFM-Tip-Integrated Amperometric Microbiosensors: High-Resolution Imaging of Membrane TransportThis work is supported by NSF (grant 0216368) within the program “Biocomplexity in the Environment”, the National Institute of Health (grant EB000508), and the “Fonds zur Förderung der wissenschaftlichen Forschung” Austria (grants P14122-CHE and J2230). PCT patent on this technology: WO0194877A1.
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- Angewandte Chemie International Edition, 2005, v. 44, n. 22, p. 3419, doi. 10.1002/anie.200461556
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Integrated AFMSECM in Tapping Mode: Simultaneous Topographical and Electrochemical Imaging of Enzyme Activity ( This work was supported by the NSF (grant No. 0216368 within the program Biocomplexity in the Environment), the Max Kade Foundation, New York, and the Fonds zur Förderung der wissenschaftlichen Forschung, Austria (grants P14122-CHE and J2230). PCT Patents are granted on this technology (WO2001094877A1 and WO2001094926A1). AFM=atomic force microscopy, SECM=scanning electrochemical microscopy. )
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- Angewandte Chemie International Edition, 2003, v. 42, n. 28, p. 3238, doi. 10.1002/anie.200351111
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