Simulation of Carrier Trapping in an Embedded Nanowire and Its Effect in the Nano-EBIC Technique.
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- Semiconductors, 2021, v. 55, n. 1, p. 56, doi. 10.1134/S106378262101005X
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- Article
Works matching AU El Hdiy, A.
Results: 5
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Simulated Contrast of Two Dislocations.
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- Semiconductors, 2019, v. 53, n. 4, p. 442, doi. 10.1134/S1063782619040195
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- Article
3
Soft Breakdown as a Cause of Current Drop in an MOS Tunnel Structure.
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- Semiconductors, 2004, v. 38, n. 6, p. 724, doi. 10.1134/1.1766379
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- Article
4
The 1/f Noise in a Two-Dimensional Electron Gas: Temperature and Electric Field Considerations.
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- Electronics & Electrical Engineering, 2009, n. 92, p. 3
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- Article
5
Ge nanocrystals with highly uniform size distribution deposited on alumina at room temperature by pulsed laser deposition: structural, morphological, and charge trapping properties.
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- Journal of Nanoparticle Research, 2012, v. 14, n. 5, p. 1, doi. 10.1007/s11051-012-0843-3
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- Article