Found: 2
Select item for more details and to access through your institution.
Fading of pMOS dosimeters over a long period of time.
- Published in:
- Micro & Nano Letters (Wiley-Blackwell), 2022, v. 17, n. 7, p. 155, doi. 10.1049/mna2.12119
- By:
- Publication type:
- Article
Radiation and Spontaneous Annealing of Radiation-sensitive Field-effect Transistors with Gate Oxide Thicknesses of 400 and 1000 nm.
- Published in:
- Sensors & Materials, 2021, v. 33, n. 6,Part 3, p. 2109, doi. 10.18494/SAM.2021.3425
- By:
- Publication type:
- Article