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Imaging of strain and lattice orientation by quick scanning X-ray microscopy combined with threedimensional reciprocal space mapping.
Published in:
Journal of Applied Crystallography, 2014, v. 47, n. 2, p. 762, doi. 10.1107/S1600576714004506
By:
- Chahine, Gilbert André;
- Richard, Marie-Ingrid;
- Homs-Regojo, Roberto Arturo;
- Tran-Caliste, Thu Nhi;
- Carbone, Dina;
- Jaques, Vincent Louis Robert;
- Grifone, Raphael;
- Boesecke, Peter;
- Katzer, Jens;
- Costina, Ioan;
- Djazouli, Hamid;
- Schroeder, Thomas;
- Urs Schülli, Tobias
Publication type:
Article
The Nanodiffraction beamline ID01/ESRF: a microscope for imaging strain and structure.
Published in:
Journal of Synchrotron Radiation, 2019, v. 26, n. 2, p. 571, doi. 10.1107/S160057751900078X
By:
- Leake, Steven J.;
- Chahine, Gilbert A.;
- Djazouli, Hamid;
- Zhou, Tao;
- Richter, Carsten;
- Hilhorst, Jan;
- Petit, Lucien;
- Richard, Marie-Ingrid;
- Morawe, Christian;
- Barrett, Raymond;
- Zhang, Lin;
- Homs-Regojo, Roberto A.;
- Favre-Nicolin, Vincent;
- Boesecke, Peter;
- Schülli, Tobias U.
Publication type:
Article