Characterization of individual nano-objects with nanoprojectile-SIMS.

Published in:

Surface & Interface Analysis: SIA, 2013, v. 45, n. 1, p. 329, doi. 10.1002/sia.5084

By:

• Liang, C. ‐ K.;
• Verkhoturov, S. V.;
• Bisrat, Y.;
• Dikler, S.;
• DeBord, J. D.;
• Fernandez ‐ Lima, F. A.;
• Schweikert, E. A.;
• Della ‐ Negra, S.

Publication type:

Article