Found: 21
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<sup>252</sup>Cf plasma desorption in ion implanted mica.
- Published in:
- Nature, 1983, v. 303, n. 5913, p. 159, doi. 10.1038/303159a0
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- Article
TOF-SIMS CHARACTERIZATION OF ORGANIC MATTER IN THE MINERAL CONTEXT OF AQUEOUS ALTERATION OF CM CHONDRITES.
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- Meteoritics & Planetary Science, 2022, v. 57, p. 6211
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- Article
Secondary Electron Emission Yields from a CsI Surface Under Impacts of Large Molecules at Low Velocities (5 × 10<sup>3</sup>−7 × 10<sup>4</sup> ms<sup>−1</sup>).
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- Rapid Communications in Mass Spectrometry: RCM, 1997, v. 11, n. 4, p. 353, doi. 10.1002/(SICI)1097-0231(19970228)11:4<353::AID-RCM865>3.0.CO;2-4
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- Article
Visualization of craters in a Langmuir-Blodgett film from the impact of 23 MeV C.
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- Rapid Communications in Mass Spectrometry: RCM, 1995, v. 9, n. 10, p. 924, doi. 10.1002/rcm.1290091012
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- Article
Ion counting and ion intensity measurements in time-of-flight mass spectrometry. Application to matrix-assisted laser desorption.
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- Rapid Communications in Mass Spectrometry: RCM, 1991, v. 5, n. 12, p. 632, doi. 10.1002/rcm.1290051214
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- Article
Time-of-flight mass spectrometry with a compact two-stage electrostatic mirror: Metastable-ion studies with high mass resolution and ion emission from thick insulators.
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- Rapid Communications in Mass Spectrometry: RCM, 1991, v. 5, n. 1, p. 40, doi. 10.1002/rcm.1290050112
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- Article
Molecular ion emission from superposed langmuir-blodgett films of different molecules in MeV ion induced desorption. Possibility of emission from a conical volume.
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- Rapid Communications in Mass Spectrometry: RCM, 1987, v. 1, n. 2, p. 22, doi. 10.1002/rcm.1290010204
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- Article
High time and mass resolution with an axial symmetry <sup>252</sup>Cf time-of-flight mass spectrometer.
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- Rapid Communications in Mass Spectrometry: RCM, 1987, v. 1, n. 1, p. 10, doi. 10.1002/rcm.1290010108
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- Article
Characteristics of positive and negative secondary ions emitted from Au<sub>3</sub><sup>+</sup> and Au<sub>400</sub><sup>+4</sup> impacts.
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- Surface & Interface Analysis: SIA, 2013, v. 45, n. 1, p. 134, doi. 10.1002/sia.5009
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- Article
Characterization of individual nano-objects with nanoprojectile-SIMS.
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- Surface & Interface Analysis: SIA, 2013, v. 45, n. 1, p. 329, doi. 10.1002/sia.5084
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- Article
Surface characterization of biological nanodomains using NP-ToF-SIMS.
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- Surface & Interface Analysis: SIA, 2013, v. 45, n. 1, p. 294, doi. 10.1002/sia.4901
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- Article
Simultaneous detection and localization of secondary ions and electrons from single large cluster impacts.
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- Surface & Interface Analysis: SIA, 2013, v. 45, n. 1, p. 529, doi. 10.1002/sia.4949
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- Article
The Pegase project, a new solid surface probe: focused massive cluster ion beams.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 66, doi. 10.1002/sia.3478
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- Article
Real-time localization of single C.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 484, doi. 10.1002/sia.3400
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- Article
Statistics of electron and ion emission from single massive cluster impacts.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 49, doi. 10.1002/sia.3568
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- Article
Photon emission from massive projectile impacts on solids.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 53, doi. 10.1002/sia.3592
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- Article
Massive clusters: Secondary emission from qkeV to qMeV. New emission processes? New SIMS probe?
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 62, doi. 10.1002/sia.3416
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- Article
ORGANIC RESIDUES FROM ULTRAVIOLET IRRADIATION OF INTERSTELLAR ICE ANALOGS.
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- EAS Publications Series, 2013, v. 58, p. 343, doi. 10.1051/eas/1258056
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- Article
Orthogonal time-of-flight secondary ion mass spectrometric analysis of peptides using large gold clusters as primary ions.
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- Rapid Communications in Mass Spectrometry: RCM, 2004, v. 18, n. 4, p. 371, doi. 10.1002/rcm.1342
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- Article
Fragmentation of neutral C<sub>n</sub> clusters (n ≤ 9): experimental and theoretical investigations.
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- European Physical Journal D (EPJ D), 2003, v. 24, n. 1-3, p. 149, doi. 10.1140/epjd/e2003-00102-1
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- Article
Track formation in III-N semiconductors irradiated by swift heavy ions and fullerene and re-evaluation of the inelastic thermal spike model.
- Published in:
- Journal of Materials Science, 2015, v. 50, n. 15, p. 5214, doi. 10.1007/s10853-015-9069-y
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- Article