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Study of the initial stages of defect generation in ion-irradiated MgO at elevated temperatures using high-resolution X-ray diffraction.
- Published in:
- Journal of Materials Science, 2016, v. 51, n. 3, p. 1456, doi. 10.1007/s10853-015-9465-3
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- Article
Strain and stress build-up in He-implanted UO single crystals: an X-ray diffraction study.
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- Journal of Materials Science, 2011, v. 46, n. 13, p. 4683, doi. 10.1007/s10853-011-5375-1
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- Article
Monitoring of the recovery of ion-damaged 4H-SiC with in situ synchrotron X-ray diffraction as a tool for strain-engineering.
- Published in:
- Journal of Materials Science, 2022, v. 57, n. 43, p. 20309, doi. 10.1007/s10853-022-07876-4
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- Article
Ionization-induced annealing in silicon upon dual-beam irradiation.
- Published in:
- Journal of Materials Science, 2020, v. 55, n. 14, p. 5938, doi. 10.1007/s10853-020-04399-8
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- Article
Monitoring by Raman spectroscopy of the damage induced in the wake of energetic ions.
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- Journal of Raman Spectroscopy, 2014, v. 45, n. 6, p. 481, doi. 10.1002/jrs.4482
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- Article